84 results about "Combinatorial testing" patented technology

The invention provides an embedded software test method based on a combinatorial test, and belongs to the field of software tests. The method solves the problems that in an existing embedded software test, the test coverage rate is low and the test efficiency is poor. The method includes the steps: (1) a data communication protocol is edited according to a port type, a data frame format, a data element type, a data element length and a data element signal range of software to be tested, (2) a virtual model is built according to a requirement specification and a corresponding document of an SUT of the software to be tested, (3) combinatorial test data are generated through a combinatorial test data generating algorithm based on replacement disturbance, a test data set is constructed in a two-dimensional extension mode and a combinatorial test data set A is generated, (4) the test data generated in the step (3) are put into the virtual model built in the step (2) and the practical tested software, obtained test results are compared, the test data resulting in different results of the virtual model and the practical tested software are analyzed, and accordingly a test conclusion is obtained. The method is used for testing software.

Provided is a system and method for black-box testing of software using positive and negative test cases with N-way combinations of parameter values. An original model comprising valid and invalid values is modified in a first phase, by generating exclusions (constraints) for pairs of invalid values. A first suite of test cases is generated from the modified model, and positive test cases eliminated, creating a first test suite with only negative tests. In a second phase, the original model is modified by eliminating invalid values, from which a second test suite having only positive test cases for all valid N-way combinations is generated. Merging the two test suites provides a suite of positive and negative test cases that test software with N-way combinations of values, in which each negative test case has only one invalid value.

The invention relates to the technical field of electronics and particularly relates to an automatic testing method for an Android device. The automatic testing method comprises the following steps of (1) providing a testing program operating in the Android device, enabling the testing program to output testing error information, providing a batch processing script operating at a computer end so as to control operation of the testing program and collect the testing error information; (2) connecting the Android device to the computer end; (3) operating the batch processing script to copy the testing program to the Android device and control the operation of the testing program on the Android device; and (4) using the batch processing script to collect testing error information outputted by the testing program in the operation process. The automatic testing method has the advantages that the batch processing script is used for being embedded into uiautomator to carry out test, the abnormality thrown by the uiautomator is used, the batch processing script is used for automatic capture, so that the automatic judgment of errors and automatic grabbing of picture and log files can be achieved, and the needs of various test cases are met. The automatic testing method is a high-efficiency and simple combined testing method for the scripts.

The invention discloses a composite test case priority sorting method based on One-test-at-a-time strategy, and belongs to the field of software testing. The method comprises the steps of according to One-test-at-a-time strategy thought, choosing one test case with the highest priority for execution in a composite test case set each time; using a calculation result of the three impact factors of a multiple rate of being to be covered, a test case failure rate and a test case importance degree and the weight factors of alpha, beta and gamma to sort test case priority; according to testing condition of the test case, adjusting an impact factor parameter value timely; then according to the adjusted impact factor parameter value, choosing a next test case with the highest priority for execution, and repeating the steps until a testing aim is achieved. The composite test case priority sorting method based on One-test-at-a-time strategy can be applied to sorting of test case priority generated by different group coverage intensities, can effectively detect more defects under circumstance of using the same test case quantity, and improve the defect detecting efficiency.

The invention discloses an embedded software test data generating method based on a fuzzy-genetic algorithm and relates to a test data generating method. The problem that a test dataset generated with an existing test data generating method is large in scale, so that generating time is long is solved. A genetic algorithm is improved, a fuzzy control method is used, through population entropy and the disperse degree, selecting of a genetic operator in a genetic process is controlled in a self-adaptation mode, when population diversity becomes poor, crossover probability and mutation probability are enlarged, so that population is evolved in a global-optimum direction, and the scale of test data is decreased. Then, an ant colony algorithm is used for sorting the generated combination test data according to the large disperse degree, so that the distance between adjacent test data values is enlarged, and test data sorting with the large disperse degree are selected from the optimum path sorting of all combination test data and is used as final embedded software test data for outputting. The embedded software test data generating method is suitable for embedded software test data generating.

The invention discloses a pair-wise test method based on priority and belongs to the technical field of software testing. The method includes steps that rules are determined through the priority, and a priority value of a dereferencing of each parameter to be tested is defined; a greedy algorithm is utilized to obtain M candidate test cases according to an one dimensional expansion strategy and the priority of the dereferencing of each parameter to be tested; the candidate test cases are coded so that an initial population can be obtained, then the initial population is evolved by a provided genetic algorithm, when the genetic algorithm stops, optimum individual is selected among the initial population, and the optimum individual is added into a test case set; and certain times of executing the steps are limited according to test conditions, and the testing is performed according to the sequence of test cases obtained in the test case set during testing. By means of the method, problems that under the condition of limited resources, the key parameters and combination can not be fully tested, the time of generating the test cases is excessively long, the defect detection rate can not be passed and the like are solved.

A generator generates tests to improve functional coverage. A functional coverage of a first set of tests is examined in respect to a functional coverage model. The functional coverage model is transformed to a combinatorial model. The coverage measurements are used to refine the combinatorial model. The combinatorial model is utilized to generate a second set of tests that have a different functional coverage than the first set of tests. The second set of tests is utilized to examine quality of a tested system.

A test program allows an information technology equipment connected to a tester hardware to control the tester hardware. The tester hardware is configured to be capable of changing at least a part of its functions according to configuration data stored in rewritable nonvolatile memory. The test program is configured as a combination of a control program and a test algorithm module. The test program comprises: a module that acquires the configuration data from the nonvolatile memory of the tester hardware and a module that judges whether or not a storage device holds a test algorithm module that can be used together with the configuration data.

The invention discloses a regression test case reusing method based on a software combination test. The method mainly includes the following steps that all combinations needing to be covered of a new model are calculated; an attempt is made reuse each existing test case, if each test case can be reused, the test case is converted into a test case under the new model and added to a test case set, the combination covered with the test case is removed, or otherwise, the test case can not be reused and is abandoned; if combinations which are not covered exist, new test cases are used for supplementation according to a traditional combination test generation method, the remaining combinations which are not covered are covered, and the new test cases are added to a new test case set; finally, the acquired test case set is a regression combination test case set reusing the existing test cases.

Embodiments of the current invention include methods of improving a process of forming a textured TCO film by combinatorial methods. The combinatorial method may include depositing a TCO by physical vapor deposition or sputtering, annealing the TCO, and etching the TCO where at least one of the depositing, the annealing, or the etching is performed combinatorially. Embodiments of the current invention also include improved methods of forming the TCO based on the results of combinatorial testing.

A method, apparatus and computer-implemented method, the method comprising: receiving a combinatorial testing model comprising an attribute collection, the attribute collection comprising a predetermined number of initial attributes, one or more possible values for each of the initial attributes, a coverage requirement, and an order coverage requirement for the initial attributes, the order coverage requirement related to predetermined relative order in which the attribute values are to be applied; and providing two or more tests in which each of the initial attributes is assigned a value from the possible values, wherein the tests satisfy the order coverage requirement for the at least two attributes.

A computer program embodied on a computer readable medium is provided for combinatorial test generation. The computer program includes a code segment that obtains an assertion, wherein the assertion includes a plurality of assertion variables, and a code segment that generates a slot tree having a plurality of nodes, wherein the slot tree represents the assertion variables of the obtained assertion. Further included is a code segment that processes the nodes of the slot tree to generate tests for the assertion. As above, the slot tree can comprise a plurality of leaf slot nodes that represent the actual assertion variables, each leaf slot node including a value set for the assertion variable that the leaf slot node represents. The slot tree can also include a plurality of non-leaf slot nodes that are capable of referencing other nodes, wherein the other nodes can be leaf slot nodes and non-leaf slot nodes.

The invention relates to a 1.25-time brake experiment zero-load testing device and a testing method of a towing lift, and can solve the technical problems that the damage of 1.25-time rated experimentto the lifts is large, and risk of experiment on old lifts is high. The 1.25-time brake experiment zero-load testing device comprises a lift static testing mechanism, a lift dynamic testing mechanism, an intelligent portable terminal and special APP analysis software, wherein the intelligent portable terminal is in communication with a speed testing mechanism and a force testing device in a wireless bluetooth manner; the combination testing of the lift speed testing mechanism and the intelligent portable terminal is dynamic testing; and the combination testing of the lift static testing mechanism and the intelligent portable terminal is static testing. The 1.25-time brake experiment zero-load testing device disclosed by the invention adopts a non-loaded detection method, and has the advantages that a link of repeatedly loading and unloading weights and regulating a weighting switch is omitted, labor cost and time cost are saved, and rental charge and cartage of the weights are saved;and under the premise that the inspection quality is guaranteed, the inspection efficiency is improved, and the damage of the 1.25-time rated load experiment to the old lifts is also avoided, and therisk of the experiment is reduced.

The invention provides a computer testing system capable of combining testing items at will and method thereof. Testing items can be combined at will to carry out computer performance test, the system mainly comprises a storage module and a test platform, the storage module is used for storing a plurality of groups of testing items used for executing corresponding test programs; the test platform selects the testing item according to test purpose, modifies the test sequence of the selected testing item and runs the testing item according to the selected test mode and test cycle number to complete test. The method mainly includes the following steps: the required testing item is selected according to test purpose, the test sequence of the selected testing item is modified, and the testing item is run by selecting test mode and test cycle number according to the test purpose, so as to complete the test. The invention not only saves labour power and time but also improves probability of finding problem, human error is reduced, and accuracy of test is improved.

A method for detecting safety chip function under DOS includes setting up test environment and interface, testing various state setting of safety chip and setting up chip owner if test is passed, setting up cipher key and carrying out test that owner information is cleared off or not if setting up is successful, testing each command combination and function of internal module in safety chip, obtaining system completeness information stored in safety chip register and then carrying out verification on completeness information mechanism .

The invention discloses a power system control unit in-the-loop simulation test system. The system comprises a driver model unit, a simulation VCU (vehicle control unit) unit, a simulation MCU (motor control unit) unit, a simulation BMS (battery management system) unit, a VCU test interface, an MCU test interface and a BMS test interface; one end of the simulation VCU unit is connected with the driver model unit, and the other end of the simulation VCU unit is connected with the VCU test interface; one end of the simulation MCU unit is connected with the driver model unit, and the other end of the simulation MCU unit is connected with the MCU test interface; and one end of the simulation BMS unit is connected with the driver model unit, and the other end of the simulation BMS unit is connected with the BMS test interface. Pathways between the driver model unit and the simulation CU (control unit) units are switched out, and pathways between the test interfaces and automobile CU (control unit) units are switched on, so a test of any combination between the simulation VCU unit, the simulation MCU unit and the simulation BMS unit of a power system control unit is achieved.

The invention discloses a business data test method and device based on a block chain and computer equipment, relates to the technical field of computers, and aims to improve the business data test efficiency of a block chain project and save the test labor cost. The method comprises the steps of obtaining each piece of functional interface information associated with a scene test of a block chainproject in a project interface document, and a chain execution sequence among the functional interface information; generating a combined test case according to each piece of functional interface information, the combined test case comprising sub-test cases of each level executed according to the chain execution sequence; and executing the combined test case, wherein whether the next-level sub-test case is executed or not is determined according to an execution result of the previous-level sub-test case. The business data testing method and device are suitable for business data testing basedon blockchain projects.

A method is disclosed for creating test cases for simulating the design and operation of an integrated circuit having operational functionality that requires adherence to a multiplicity of operating rules, wherein the test cases are created in such a way that modularized component test cases can be combined and comprises creating and storing a plurality of component test cases for simulating the design and various aspects of the operational functionality of the integrated circuit, wherein each of the component test cases have data defining a predetermined configuration and a predetermined stimulus, each component test case being written to comply with the operating rules, and selectively combining and running two or more of the plurality of component test cases as a combined test case.

The invention discloses a weight-based combined test case set prioritization sorting method and system, and the method comprises the following steps: 1, determining the range of combined coverage force t according to a parameter set of a to-be-tested program, generating a t-dimensional combination of the to-be-tested program based on the combined coverage force t, and defining the t-dimensional combination as a set A; 2, prioritizing the test case sets of the programs to be tested, recording the time cost of optimizing the whole test case set each time and the average time cost after 200 timesof operation, and outputting the result set and the time cost in the form of files; And step 3, performing a simulation experiment on the obtained optimized test case set to the program to be tested,and recording the error detection rate of the program to be tested. According to the method, on the premise of ensuring the time cost, the obtained optimized test case set can have a better error detection rate in a simulation experiment, so that the time cost required by a test stage in an actual test is reduced, and the test efficiency is improved.