Information systems test combination generation method based on coverage density

Abstract

The present invention discloses a composite generation method based on information system testing for coverage density, which adopts a framework (as shown) that: (1) input parameters and parameter values of information system to be tested are described through XML files according to the specification of the tested system; (2) the testing use cases needed to appear and the testing use cases which cannot appear through combination in pairs are assigned; (3) the values of all the input parameters are combined one by one on the basis of coverage density so as to generate a testing use case; (4) the testing use case finally generated is expressed and output in the format of the XML files. The composite generation method can be widely applied to embedded system testing, distributed system testing, web page testing, graphical interface testing, protocol testing, configuration and compatibility testing, etc., is easy to append constraints among the parameters and consider the parameter combinations needed to be covered, is easy to consider the priority among the parameters, is simple and effective in the calculation method of coverage density, and has good expansibility.

Description

technical field [0001] The invention relates to a method for automatically generating test cases of an information system. Under the condition of given input parameters and parameter values, the method can automatically generate test cases covering all pairwise combinations with as few as possible. The invention can be widely used in embedded system testing, distributed system testing, web page testing, graphical interface testing, protocol testing, configuration and compatibility testing and the like. Background technique [0002] Today's computer information systems are becoming larger and more complex. When testers test an information system, the system may have many input parameters (usually greater than 10), and each input parameter may have multiple different Value or equivalence class division (usually greater than 3). Before the information system is released to the market, it must be thoroughly tested in order to ensure its quality. [0003] Combined testing techn...

AI Technical Summary

Problems solved by technology

There are two limitations: first, the number of values ​​for each input parameter must be equal; second, for a specific number of parameters and values, there is no suitable orthogonal matrix, and the number of parameters and values ​​needs to be increased

These two limitations unnecessarily increase the number of test cases

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