Image processing method for distance measurement

Abstract

The invention provides an image processing method for distance measurement, and the method is used for obtaining the thickness of a measured object based on a distance measurement image, the measured object is made of a transparent material, and the method comprises the steps: employing a laser sensor to emit a laser beam to the measured object; pixel positions and corresponding voltage values of two light spots of a light beam reflected by the measured object are obtained, and the voltage values of the two light spots are separated based on a first set voltage threshold value to form two voltage value sets; the centroids of the pixel position sets corresponding to the two voltage value sets are obtained based on a gray centroid algorithm, and the distances L1 and L2 between the laser transmitter and the front surface and the rear surface of the measured object are obtained according to the centroids and the triangulation ranging principle; and obtaining the thickness of the measured object based on the L1 and the L2. According to the invention, the thickness of the measured object is obtained by making full use of multiple reflections, and the thickness measurement cost can be reduced.

Description

technical field [0001] The present application relates to the technical field of optical measurement, in particular to an image processing method for distance measurement. Background technique [0002] In real life, the thickness of many products needs to be measured to ensure the quality of the product. At present, the commonly used thickness measurement method is to measure the thickness of the measured object according to the spectral confocal method. On the upper surface of the object to be measured, the distance between the object to be measured and the laser emitter must meet the converging point of the laser beam of this wavelength on the object to be measured, and the laser beam of this wavelength will be reflected back. According to the reflected laser beam The wavelength of the measured object can be obtained by using the spectral confocal method to obtain the thickness of the measured object with high precision, but the cost of obtaining the thickness of the meas...

AI Technical Summary

Problems solved by technology

At present, the commonly used thickness measurement method is to measure the thickness of the measured object according to the spectral confocal method. On the upper surface of the object to be measured, the distance between the object to be measured and the laser emitter must meet the converging point of the laser beam of this wavelength on the object to be measured, and the laser beam of this wavelength will be reflected back. According to the reflected laser beam The wavelength of the measured object can be obtained by using the spectral confocal method to obtain the thickness of the measured object with high precision, but the cost of obtaining the thickness of the measured object by this method is relatively high, and the convergence point of multiple laser beams with different wavelengths They are all on the measured object, and the measuring range is short, so it is not suitable for measuring the measured object with long distance and large thickness.

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