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Method suitable for overhauling defects of LED circuit board

A technology for LED circuit boards and defects, applied in electronic circuit testing, instruments, measuring devices, etc., can solve problems such as repairing methods for bad defects in LED circuit boards, improve testing and repairing efficiency, eliminate the risk of missed detection, and improve versatility Effect

Pending Publication Date: 2022-06-07
昆山格威测电子有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0011] In order to solve the above-mentioned technical problems, the purpose of the present invention is to provide a method for repairing defective defects of LED circuit boards

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0036] The specific embodiments of the present invention will be further described in detail below with reference to the examples. The following examples are intended to illustrate the present invention, but not to limit the scope of the present invention.

[0037] It is suitable for the repair method of defective LED circuit board, and its difference is that it includes the following steps:

[0038] In step 1, the LED circuit board is tested by a high-precision automatic testing machine, and a test result data file is generated. Considering the convenience of implementation, the test result data files are data packets containing defect logs, which are encapsulated and saved in the dat format commonly used by high-precision inspection machines, which is convenient for subsequent processing. During implementation, the contents of the data package may include: item number name, batch number board serial number, date and time, test table number, test block number, defective code...

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PUM

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Abstract

The invention relates to a method suitable for overhauling defects of an LED circuit board, and the method comprises the steps: detecting the LED circuit board through a high-precision automatic testing machine, and generating a test result data file; and converting the test result data file to generate connection test data suitable for the connection flying probe machine. And detecting the connection test data through the connection flying probe machine. And generating a final detection result. Therefore, hundreds of thousands of LED boards can be tested only by manufacturing one set of jig, and open circuit defect data can be obtained after testing. The conversion of a test result data file can be realized through software, and defect data becomes overhaul data which can be read by a flying probe machine. And the wiring flying probe machine can be used for completing wiring maintenance for each plate at one time, so that the test maintenance efficiency is greatly improved, and the risk of missed test caused by multiple tests is avoided. Automatic detection can be realized, and complicated manual operation is avoided.

Description

technical field [0001] The invention relates to an overhaul method, in particular to a repair method for defective defects of LED circuit boards. Background technique [0002] The existing wiring test systems and methods can only solve conventional motherboards, memory boards, automotive boards, and early ordinary LED boards, etc., and each unit of the board is a relatively simple circuit board completed in one test. The mold used is greatly restricted in use, so that it cannot solve the purpose of the wire test in a safe, effective, fast and low-cost manner. [0003] For example, the size of an LED substrate is 132.5*170mm, and the welding surface of the lamp bead has 60,000 welding points (ie test points). Production capacity, it is impossible to test all 60,000 test points of this board by making only one set of fixtures. According to the network relationship of the internal circuits of the board, it may be divided into 5 sets or 6 sets of fixtures for production, that i...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/2812
Inventor 尹会运朱国庆
Owner 昆山格威测电子有限公司