Random testing method of microprocessor
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- 上海华园微电子技术有限公司
- Publication Date
- 2005-01-19
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention relates to a method for testing a microprocessor, in particular to a method for testing a microprocessor by using random numbers. Background technique
[0002] In the development process of the microprocessor, it is very critical to test its instruction system accurately and rigorously. The development cycle of the microprocessor is often prolonged due to the heavy workload of the test, and the reliability of the microprocessor is seriously affected because the instruction system test is not comprehensive enough. At present, it is the basic method of microprocessor testing to simulate and test the microprocessor by writing test instructions one by one by testers. Specifically, it is divided into classification test and unified test:
[0003] Classification test: Arrange one or more testers to test the instructions of the microprocessor one by one to ensure the correctness of the execution of each type of instruction. First of all, this...