Random testing method of microprocessor

A microprocessor and random testing technology, applied in electrical digital data processing, instrumentation, error detection/correction, etc., can solve problems such as low coverage and low microprocessor efficiency, and achieve the goal of speeding up the development cycle and ensuring reliability. Effect
CN1567209AInactive Publication Date: 2005-01-19上海华园微电子技术有限公司

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
上海华园微电子技术有限公司
Publication Date
2005-01-19
Estimated Expiration
Not applicable · inactive patent

Smart Images

  • Figure 1
    Figure 1
  • Figure 2
    Figure 2
  • Figure 3
    Figure 3
Patent Text Reader

Abstract

This invention relates to a kind of random testing method of microprocessor. It comprises the following steps: (1) generating N random instructions based on random number (N is positive integral); (2) testing microprocessor by these N random instructions. It solves the problem of low efficiency and low coverage in the course of microprocessor testing. It speeds up the development cycle of microprocessor and ensures the dependability of microprocessor.
Need to check novelty before this filing date? Find Prior Art

Description

technical field

[0001] The invention relates to a method for testing a microprocessor, in particular to a method for testing a microprocessor by using random numbers. Background technique

[0002] In the development process of the microprocessor, it is very critical to test its instruction system accurately and rigorously. The development cycle of the microprocessor is often prolonged due to the heavy workload of the test, and the reliability of the microprocessor is seriously affected because the instruction system test is not comprehensive enough. At present, it is the basic method of microprocessor testing to simulate and test the microprocessor by writing test instructions one by one by testers. Specifically, it is divided into classification test and unified test:

[0003] Classification test: Arrange one or more testers to test the instructions of the microprocessor one by one to ensure the correctness of the execution of each type of instruction. First of all, this...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More