Random testing method of microprocessor

A microprocessor and random testing technology, applied in electrical digital data processing, instrumentation, error detection/correction, etc., can solve problems such as low coverage and low microprocessor efficiency, and achieve the goal of speeding up the development cycle and ensuring reliability. Effect

Inactive Publication Date: 2005-01-19
上海华园微电子技术有限公司
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  • Abstract
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  • Claims
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Problems solved by technology

[0007] The technical problem to be solved by the present invention is to provide a random testing method for microprocessors, which aims to solve the defects of low efficiency and low coverage in the current testing process of microprocessors

Method used

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  • Random testing method of microprocessor
  • Random testing method of microprocessor

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Embodiment Construction

[0014] Below in conjunction with accompanying drawing and specific embodiment the present invention is described in further detail:

[0015] Depend on figure 1 Visible: the present invention is realized through the following steps:

[0016] Generate N random instructions 1 based on random numbers; said N is a positive integer;

[0017] Test the microprocessor with N random instructions2.

[0018] It can be seen from Figure 2 that the generation of N random instructions based on random numbers is achieved through the following steps:

[0019] Read random number seed 11; Described step 11 is to read three data from depositing the file of random number seed respectively as the random number seed that produces operation code and first, second operand;

[0020] Random number generation 12; Described step 12 is to utilize the random number seed of operation code and first, second operand to produce three random numbers by random function, as operation code and first, second opera...

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Abstract

This invention relates to a kind of random testing method of microprocessor. It comprises the following steps: (1) generating N random instructions based on random number (N is positive integral); (2) testing microprocessor by these N random instructions. It solves the problem of low efficiency and low coverage in the course of microprocessor testing. It speeds up the development cycle of microprocessor and ensures the dependability of microprocessor.

Description

technical field [0001] The invention relates to a method for testing a microprocessor, in particular to a method for testing a microprocessor by using random numbers. Background technique [0002] In the development process of the microprocessor, it is very critical to test its instruction system accurately and rigorously. The development cycle of the microprocessor is often prolonged due to the heavy workload of the test, and the reliability of the microprocessor is seriously affected because the instruction system test is not comprehensive enough. At present, it is the basic method of microprocessor testing to simulate and test the microprocessor by writing test instructions one by one by testers. Specifically, it is divided into classification test and unified test: [0003] Classification test: Arrange one or more testers to test the instructions of the microprocessor one by one to ensure the correctness of the execution of each type of instruction. First of all, this...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/00
Inventor 白宁徐云秀印义言
Owner 上海华园微电子技术有限公司
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