Method of error compensation in a coordinate measuring machine with an articulating probe head
An error compensation and articulation technology, applied in the field of error compensation of coordinate measuring instruments with articulated probes, can solve the problems of increasing the mass, complexity and cost of articulated probes
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[0043] figure 1 Shown is the articulating scan head mounted on a coordinate measuring machine (CMM). The articulating probe 10 is mounted on the bottom end of a vertically extending extension or Z-direction column 12 of the CMM 8 . The Z column 12 is supported for movement in the Z direction by bearings, such as air bearings 14 , which are integrated with a bracket 16 , which in turn is supported by a beam 18 for movement in the X direction. The beam 18 is supported by rails 20 mounted on a platform 22 for movement in the Y direction. The articulating probe 10 can thus be positioned anywhere in the X, Y and Z directions within the working volume of the instrument. The controller issues instructions to the CMM and articulating probe to position the articulating probe and probe mounted thereon in any desired position. The controller also receives feedback from the CMM, articulating probes and probes.
[0044] As shown in Figure 2, the articulating scanning probe 10 comprises...
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