Methods and apparatus using a hierarchical test development tree to specify devices and their test setups

A technology for devices under test and devices, applied in the field of hierarchical test development tree specifying devices and their test settings, which can solve problems such as expensive, cycle-increasing delay, and time-consuming

Inactive Publication Date: 2007-01-10
VERIGY PTE
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

While test developers have a great deal of freedom in developing custom tests, this is an expensive and time-consuming process that can add substantial delays to a device's "time to market" cycle

Method used

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  • Methods and apparatus using a hierarchical test development tree to specify devices and their test setups
  • Methods and apparatus using a hierarchical test development tree to specify devices and their test setups
  • Methods and apparatus using a hierarchical test development tree to specify devices and their test setups

Examples

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Embodiment Construction

[0012] figure 1 and Figure 9 An exemplary computer-implemented method 100, 900 for specifying a device and its test setup is shown. Methods 100, 900 may be used individually or in combination.

[0013] Method 100 ( figure 1 ) includes displaying (102) a hierarchical test development tree 200 within a graphical user interface (GUI 202) of an automated test development environment ( figure 2 ). like figure 2 As shown, tree 200 includes one or more nodes 204 to which device branches 206 , 208 , 210 , 212 (ie, branches corresponding to devices under test (DUTs)) are added. A pin configuration branch and a test setup branch are automatically associated with each of the device branches 206-212 (104). For example, see as a result of expanding device branch 208 displayed at figure 2 The pin configuration branch 214 and the test setup branch 216 in . In response to user interaction with branches 206-218 of tree 200, including device branches 206-212, a plurality of windows,...

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PUM

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Abstract

The invention provides methods and apparatus using a hierarchical test development tree to specify devices and their test setups. In one embodiment, a computer program is provided with code to display a hierarchical test development tree within a GUI of an automated test development environment. The tree has a node to which device branches corresponding to DUTs are added. The computer program is also provided with code to automatically associate a pin configuration branch and a test setups branch with each device branch; and code to, in response to user interaction with branches of the tree, display a number of windows for specifying the DUTs and their test setups. Other embodiments are also disclosed.

Description

technical field [0001] The present invention relates to a method and apparatus for specifying devices and their test setups using a hierarchical test development tree. Background technique [0002] Before electronic devices, including systems or components such as circuit boards, integrated circuits, or systems on chips (SOCs), are manufactured and / or distributed, the devices are typically tested to determine whether they construct or function as designed. Typically, such testing is performed by automated test equipment (ATE, also referred to as a "tester"). [0003] Before using ATE to test a device, a test developer must develop a series of tests that the ATE will execute while testing the device. This has historically been done on a custom basis for each device the ATE is testing. While test developers have a lot of freedom in developing custom tests, this is an expensive and time-consuming process that can add significant delays to a device's "time to market" cycle. ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R31/317G06F11/22G06F3/048G06F3/0484
CPCG06F11/263G01R31/318314G06F11/26G06F9/00G06F11/36G06F3/0481
Inventor 周正容
Owner VERIGY PTE
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