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Defect detecting device, image sensor device, and image sensor module

A defect detection and defect technology, applied in image enhancement, image analysis, image data processing, etc., can solve the problems of larger circuit structure and longer time, and achieve the effect of compact circuit structure

Inactive Publication Date: 2007-04-04
SHARP KK
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  • Claims
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Problems solved by technology

That is to say, when using the prior art disclosed in the above-mentioned non-patent literature to detect whether there is a defect area in a general digital image, it will happen that (1) the time required for judging whether there is a defect area becomes longer, (2) the circuit structure Bigger these two questions

Method used

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  • Defect detecting device, image sensor device, and image sensor module
  • Defect detecting device, image sensor device, and image sensor module
  • Defect detecting device, image sensor device, and image sensor module

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Embodiment Construction

[0081] (1. Basic structure of the device)

[0082] One embodiment of the defect detection device of the present invention will be described using FIG. 1 . As shown in FIG. 1 , the defect detection device 1 of the present embodiment includes: an image reduction unit (image reduction device) 2, a point defect removal unit (point defect removal device) 3, a filtering unit (filtering device) 4, and a block division unit (block division device) 5, block addition value calculation unit (block addition value calculation unit) 6, statistical processing unit (defect area presence or absence judgment unit) 7, good or bad judgment unit (defect area presence or absence judgment unit) 8 , memory 9.

[0083] The image reduction unit 2 performs a process of reducing the vertical size and the horizontal size of the detected image to reduce the detected image. Thereby, the amount of data of the detected image can be reduced, and the speckle defect and lump defect existing in the detected ima...

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Abstract

A defect detecting device includes: a block generating section dividing an inspection image in which a defective region will be detected into a plurality of blocks; an intra-block sum calculating section calculating an intra-block sum for each of the blocks generated by the block generating section, the intra-block sum being a sum of pixel data for pixels in that block; and a statistical processing section and a defect determining section determining whether there exists a defective region by determining through statistical processing whether the intra-block sums have an outlier. Accordingly, the device determines whether there is a defective region in a digital image quickly and using small circuitry.

Description

technical field [0001] The present invention relates to a defect detection device, image sensor device (ImageSensor Device), image sensor module, image processing device, digital image A quality tester, a defect detection method, a defect detection program, and a computer-readable recording medium. According to the present invention, whether there is a defect area in a digital image can be judged in a short time through a compact circuit structure. The invention is particularly suitable for quality detection of image sensor devices with higher quality requirements. In addition, the present invention is not only suitable for detecting the output image of the image sensor device, but also suitable for detecting the digital image displayed on the flat panel represented by the liquid crystal panel. Background technique [0002] When performing a digital image quality test, it is very important to judge whether there is a defect area, and the defect area refers to an area where...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T5/00
CPCG06T7/0004
Inventor 口井敏匡市原英行
Owner SHARP KK
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