Unlock instant, AI-driven research and patent intelligence for your innovation.

Process for forming differential spaces in electronics device integrated on a semiconductor substrate

a technology of semiconductor substrate and electronic device, which is applied in the direction of semiconductor devices, electrical equipment, basic electric elements, etc., can solve the problems of complex process steps for forming these advanced technology lv transistors, especially those pertaining to the formation of junction implants (source and drain regions), and the integration of high-performance lv transistors with hv transistors handling high voltage for writing to memory cells, so as to achieve the effect of reducing the overall dielectric constan

Inactive Publication Date: 2008-08-28
STMICROELECTRONICS SRL
View PDF4 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0015]One embodiment of the invention is a process for forming, in a same electronic device integrated on a semiconductor substrate, electronic components with spacers of different widths, having such structural and functional characteristics as to minimize the overall dielectric constant of the dielectric layers which separate some electronic components of the device, thereby overcoming the limits and / or drawbacks still limiting the devices formed according to the prior art.

Problems solved by technology

The process steps for forming these advanced technology LV transistors, especially those pertaining to the formation of the junction implants (source and drain regions) and of the spacers are particularly complex.
In particular, the integration of the high performance LV transistors with the HV transistors handling the high voltages for writing to the memory cells is further complex, with the need of introducing differential spacers and junction implants.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Process for forming differential spaces in electronics device integrated on a semiconductor substrate
  • Process for forming differential spaces in electronics device integrated on a semiconductor substrate
  • Process for forming differential spaces in electronics device integrated on a semiconductor substrate

Examples

Experimental program
Comparison scheme
Effect test

second embodiment

[0111]With reference to FIGS. 10a1 to 17a3, a process according to the invention is described.

[0112]The process steps described with reference to the FIGS. 1a1-3a3 are the same as those of the process according to this second embodiment the invention and for this reason they will not be described again.

[0113]Elements being structurally and functionally identical to the process steps described with reference to FIGS. 1a1-9a3 will be given the same reference numbers.

[0114]As shown in FIGS. 10a1-10a3, a removal step of the second insulating layer 11 is then carried out until the protective layer 10 is exposed to form the first spacers 11a.

[0115]Advantageously, this removal step is for example carried out by means of an anisotropic step. In particular, due to the conformation of the source region 8a31 of the memory cell 3, the second insulating layer 11 is only partially removed from the source region 8a31.

[0116]A first mask 12a (non-critical) is then formed on the first portion of the...

first embodiment

[0171]With this alternative sequence a plurality of spacers with different lengths is obtained, as in the process according to the invention (with possible re-calibration of the thickness of the layers deposited with respect to the dimensions of the spacers, in the case in which the dimension of the spacer does not correspond to the thickness of the insulating layers to be etched) by substituting a succession of anisotropic etchings for the single final anisotropic etching, with the same cost in terms of masks.

[0172]The choice between the two schemes depends on the selectivity on the protective layer (for example nitride) the etching steps (isotropic and anisotropic) of the insulating layers (for example of oxide) succeed in ensuring and on the overall morphology of the spacers, which is function also of the height of the gate electrodes in circuitry and in matrix.

[0173]The process according to the embodiments of the invention can be applied to any electronic device and in particula...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A forms spacers in a electronic device integrated on a semiconductor substrate that includes: first and second transistors each comprising a gate electrode projecting from the substrate and respective source / drain regions. The process comprises: forming in cascade a first protective layer and a first conformal insulating layer of a first thickness on the whole electronic device; forming a first mask to cover the first transistor; removing the first conformal insulating layer not covered by the first mask; removing the first mask; forming a second conformal insulating layer of a second thickness on the whole device; and removing the insulating layers until the protective layer is exposed to form first spacers of a first width on the side walls of the gate electrodes of the first transistor and second spacers of a second width on the side walls of the gate electrodes of the second transistor.

Description

BACKGROUND OF THE INVENTION[0001]1. Field of the Invention[0002]The present invention relates to a process for forming of differential spacers in electronic devices integrated on a semiconductor substrate.[0003]The invention particularly, but not exclusively, relates to a process for forming differential spacers in floating gate non-volatile memory devices and the following description is made with reference to this field of application by way of illustration only.[0004]2. Description of the Related Art[0005]As it is well known, non-volatile memory electronic devices, for example of the Flash type, integrated on semiconductor substrate comprise a matrix of non-volatile memory cells organized in rows, called word lines, and columns, called bit lines.[0006]Each single non-volatile memory cell comprises a MOS transistor wherein the gate electrode, arranged above the channel region, is floating, i.e., it shows high impedance in DC towards all the other terminals of the same cell and of ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(United States)
IPC IPC(8): H01L21/336
CPCH01L27/105H01L29/66553H01L27/11546H01L27/11526H10B41/40H10B41/49
Inventor SERVALLI, GIORGIOALBINI, GIULIOCREMONESI, CARLO
Owner STMICROELECTRONICS SRL