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Multiple testing bars for testing liquid crystal display and method thereof

Inactive Publication Date: 2010-10-26
SAMSUNG DISPLAY CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0019]It is an object of the present invention to provide a TFT array panel having shorting bars that are superior in detecting short-circuit defects as well as discharging electrostatic charges.
[0020]It is another object of the present invention to provide a test methods to detect short-circuit defects between adjacent data lines or adjacent gate lines and pixel defects with ease.
[0021]It is another object of the present invention to provide a test method to effectively detect some defects in a high-resolution substrate.
[0028]According to the LCDs and the manufacturing methods of the present invention, the additional gate shorting bars or the additional data shorting bars are formed and separated from the main shorting bar after the process is over. Accordingly, the LCD substrate is superior in detecting short-circuited defects of the substrate as well as in discharging the electrostatic charges.
[0030]In this test method according to the present invention, it is possible to detect short-circuited defects between adjacent pixels or adjacent wires, and the detecting ability of visual defects and the reliability are increased.

Problems solved by technology

However, if more than two gate lines or data lines, for example, the data lines D2 and D3 in FIG. 1, are short-circuited (S1), it is hard to detect the short-circuited elements since the voltage of the same magnitude and polarity is applied to the two data lines D2 and D3.
However, the protecting capability against electrostatic charges may decrease.

Method used

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  • Multiple testing bars for testing liquid crystal display and method thereof
  • Multiple testing bars for testing liquid crystal display and method thereof
  • Multiple testing bars for testing liquid crystal display and method thereof

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Experimental program
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Effect test

second embodiment

[0067]A second embodiment shown in FIG. 7 has a structure in which the additional step of removing the gate shorting bar is not required before the array tests.

[0068]The structure of the connection between the first and the second secondary lines 410 and 420 and the gate extensions 101, 102 and 103 in the second embodiment is similar to the structure in the first embodiment, but each gate extension is separated from the gate shorting bar 200 in a manner that some portions of the gate extensions 101, 102 and 103, the gate insulating film 150 and the passivation film 250 between the gate shorting bar 200 and the first secondary line 410 are removed. The gate extensions 101, 102 and 103 are separated from the gate shorting bar 200 in the final manufacturing step and it will be described more in detail afterward.

[0069]In the second embodiment, the step of cutting the substrate before the array test is not required because the gate shorting bar 200 and the secondary lines 410 and 420 are...

first embodiment

[0070]Instead, after the test, the secondary lines 410 and 420 are removed simultaneously by cutting the substrate along the cutting line L2 as in the

[0071]FIG. 9 is an enlarged layout view of a portion C in FIG. 5FIG. 10 is a cross-sectional view taken along line X—X′ in FIG. 9, which specially show the connection of a data shorting bar to a third secondary line, a fourth secondary line and a fifth secondary line.

[0072]As shown in FIGS. 9 and 10, a third, a fourth and a fifth secondary lines 210, 220 and 230 made of the same metal as a gate wire are formed on a substrate 1 in the horizontal direction, and a gate insulating film 150 is deposited thereon. A data wire 55, including data lines D1, D2, D3 and D4, data pads 510, 520, 530 and 540, data extensions 501, 502, 503 and 504 extending from the data pads and a data shorting bar 400 connected to the data extensions, is formed on the gate insulating film 150. A passivation film 250 is formed thereon.

[0073]Contact holes F, H and J a...

third embodiment

[0125]FIG. 18 shows testing wave forms to improve this problem.

[0126]In FIG. 18, signals DR, DG and DB applied to R, G and B pixel columns and signals Godd and Geven applied to odd and even gate lines are mostly similar to the signals in the second embodiment. Instead, the signals applied to the R, G and B pixel columns invert with a period of two times the width of the gate pulse.

[0127]Therefore, there is no difficulty in charging the R, G and B signals into the pixels, it is easy to synchronize the gate pulse and the data signals, and the flicker effect is reduced. As a result, the test method according to the third embodiment is superior in testing a uniformity and defects under high and off states.

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Abstract

A plurality of gate lines are formed on an insulating substrate in the horizontal direction, a gate shorting bar connected to the data lines is formed in the vertical direction and a gate insulating film is formed thereon. A plurality of data lines intersecting the gate lines are formed on the gate insulating film in the vertical direction, and a data shorting bar connected to the data lines is formed outside the display region. A first shorting bar is formed on the gate insulating film, located between the gate lines and the gate shorting bar, and connected to the odd gate lines. A second secondary shorting bar is formed parallel to the first shorting bar and connected to the even gate lines.

Description

CROSS REFERENCE TO PRIOR APPLICATIONS[0001]The application is a reissue application from U.S. patent application Ser. No. 09 / 206,317 filed on Dec. 7, 1998 and issued as U.S. Pat. No. 6,734,925 on May 11, 2004, claiming priority to and the benefit of Korean Patent Application No. 1998-49389 filed on Nov. 18, 1998, and Korean Patent Application No. 1997-66154 filed on Dec. 5, 1997.<?insert-end id="INS-S-00001" ?>BACKGROUND OF THE INVENTION[0002](a) Field of the Invention[0003]The present invention relates to liquid crystal displays (referred as LCDs hereinafter), manufacturing methods thereof and testing methods thereof, in particular, to LCDs having more than two shorting bars, and methods for detecting defects in the LCDs by using the shorting bars.[0004](b) Description of the Related Art[0005]Shorting bars of a liquid crystal display are used to discharge a electrostatic charges generated in the manufacturing process of the LCD and to test the LCD after the manufacturing proc...

Claims

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Application Information

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IPC IPC(8): G02F1/1333G02F1/1343G01R31/00G02F1/133G02F1/136G02F1/1362G02F1/1368G09F9/35H01L21/00
CPCG02F1/1345G02F1/1362G02F1/136204G02F1/136286G02F1/136254
Inventor LEE, SANG-KYOUNGKIM, DONG-GYUMOON, MIN-HYUNG
Owner SAMSUNG DISPLAY CO LTD
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