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Electrostatic discharge protecting circuit

A technology for electrostatic discharge protection and circuits, which is applied in emergency protection circuit devices, emergency protection circuit devices and circuits for limiting overcurrent/overvoltage, and can solve the problems of increased cost expenditure, load effect, and inapplicability of broadband radio frequency circuits, etc. problems, to achieve the effect of strengthening the electrostatic discharge resistance

Active Publication Date: 2007-09-19
VIA TECH INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0018] 1. The electrostatic discharge protection circuit causes a load effect on its internal circuit and affects the overall performance;
[0019] 2. The leakage current of the electrostatic discharge protection circuit itself is too large, which increases power consumption;
[0020] 3. The driving voltage of the electrostatic discharge protection circuit is too high, and the electrostatic discharge current cannot be discharged in time to achieve the protective effect;
[0021] 4. The electrostatic discharge protection circuit itself can withstand insufficient electrostatic discharge voltage, which reduces the ability of the electrostatic discharge protection circuit to protect the internal circuit;
[0022] 5. The electrostatic discharge current cannot evenly flow through the electrostatic discharge protection circuit, so that even if the area of ​​the electrostatic discharge protection circuit is increased, there is no guarantee that the protection efficiency of the electrostatic discharge can be improved accordingly;
[0023] 6. In order to achieve comprehensive electrostatic discharge protection, the electrostatic discharge protection circuit needs at least three electrostatic discharge protection components, resulting in an increase in area;
[0024] 7. Electrostatic discharge protection circuits are sometimes implemented using additional manufacturing processes, such as ESDimplant, which increases costs; and
[0025] 8. The electrostatic discharge protection circuits currently on the market are not suitable for broadband radio frequency circuits

Method used

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Embodiment Construction

[0075] Please refer to FIG. 6 . FIG. 6 is a cross-sectional view of an ESD protection circuit 100 in a preferred embodiment of the present invention. The electrostatic discharge protection circuit 100 includes an N-type semiconductor substrate (N-substrate) 102, a first P-type well (P-well) 104, a second P-type well 106, and a third P-type well 108. A P-type well 104 , a second P-type well 106 and a third P-type well 108 are all disposed on the semiconductor substrate 102 . The first P-type well 104 is provided with a first P + Doped region (P + region) 110 and a first N + Doped region (N + region) 112, are used to electrically connect to the ground pin (GND pad) GND of an integrated circuit chip, and a second P-type well 106 is provided with a second P + Doped region 114 and a second N + The doped region 116 is used to electrically connect to the power supply pin (VDD pad) VDD of the integrated circuit chip, and a third N-type well 108 is provided on the third P-type wel...

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PUM

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Abstract

The invention provides a static discharge protecting circuit, containing a semi- conductor substrate, first, second and third P-type traps all arranged on the substrate, where there is a first P+ doped region and a first N+ doped region arranged on the first P-type trap, the first P+ and N+ doped regions are grounded, there is a second P+ doped region and a second N+ doped region arranged on the second P+-type trap, the second P+ and N+ doped regions are connected to a power supply voltage VDD, and there is a third N+ doped region and a third P+ doped region as well as a fourth N+ doped region arranged on the third P-type trap, where the three doped regions outputs signals.

Description

technical field [0001] The present invention relates to an electrostatic discharge protection circuit, in particular to a circuit including PS (Positive to VSS), NS (Negative to VSS), PD (Positive to VDD), ND (Negative to VDD) and DS (VDD to VSS), etc. ESD protection circuit with five test modes. Background technique [0002] In recent years, the improvement of integrated circuit manufacturing process technology has enabled the size of integrated circuits (integrated circuits, ICs) such as complementary metal oxide semiconductor field effect (CMOS) transistors to be further reduced from submicron (submicron) To the deep sub-micron (deep-submicro), in order to reduce manufacturing costs and improve computing performance. However, the protection capability of integrated circuits against electrostatic discharge (ESD) will be weakened as the size shrinks. For example, when the channel width (channel width) of an output buffer (output buffer) element is set to 300 microns, the ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L23/60H02H9/00
Inventor 郑念祖何志龙施博议
Owner VIA TECH INC