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Lens seat testing device and method

A technology of testing device and mirror base, which is applied in the direction of measuring device, optical instrument test, machine/structural component test, etc. It can solve the problems of large measurement error, low yield rate and time-consuming, so as to improve efficiency and improve yield rate Effect

Inactive Publication Date: 2011-09-28
HONG FU JIN PRECISION IND (SHENZHEN) CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The usual practice is to take samples and manually operate the electrometer to test the resistance value of the sample coating. It is understandable that this method is time-consuming and has a large measurement error and a low yield

Method used

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  • Lens seat testing device and method
  • Lens seat testing device and method
  • Lens seat testing device and method

Examples

Experimental program
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Embodiment Construction

[0018] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0019] see figure 1 , a mirror base testing device 10 provided in the first embodiment of the present invention is used to test the resistance of the anti-electromagnetic interference coating on the outer peripheral surface of the mirror base 110 . The mirror base testing device 10 includes a carrying platform 11 , a testing unit 12 and a control unit 13 .

[0020] The carrying platform 11 is used for carrying an array composed of a plurality of mirror bases 110 . The carrying platform 11 can move in its plane, preferably, the mirror base testing device 10 also includes a base 15 and two independent stepping motors (not shown), the carrying platform 11 is connected to the The two stepping motors, the control unit 13 is electrically connected to the two independent stepping motors to provide electric pulses to the two independent stepping motors to drive the...

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Abstract

The invention relates to a microscope base testing device and a testing method thereof, which are used for automatically testing the resistance of anti-electromagnetic interference coating layers on the surfaces of a plurality of microscope bases. The microscope base testing device comprises a bearing platform, a control unit and a testing unit. The bearing platform is used for bearing an array formed by the microscope bases; the control unit is used for controlling the bearing platform to move within a plane coordinate where the control unit is positioned and aligning with the microscope bases and the testing units, so that the testing unit is used for testing the resistance of the anti-electromagnetic interference coating layers on the surfaces of the microscope bases in sequence and sending testing results to the controlling unit to judge whether the microscope bases are qualified or not. The microscope base testing device further comprises a removing unit; and the control unit controls the removing unit to remove the unqualified microscope bases.

Description

technical field [0001] The invention relates to a testing device and a testing method, in particular to a testing device and a testing method for testing the surface resistance of a mirror base of a lens module. Background technique [0002] With the development of camera technology, lens modules are widely used in camera devices for various purposes, and the combination of lens modules with various portable electronic devices such as mobile phones and computers is favored by many consumers. [0003] However, with the development of portable electronic devices toward the direction of diversified functions, their components are becoming more and more complex, and most of the components need to be powered on to work, which makes the portable electronic devices easily affected by electromagnetic interference. normal work. [0004] Lens modules are usually widely used in portable electronic devices as components of camera devices, and generally include lenses, mirror mounts, fi...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G03B43/00G01M11/00G01R27/02
Inventor 陈汉邦
Owner HONG FU JIN PRECISION IND (SHENZHEN) CO LTD