Check apparatus

Abstract

The present invention provides a check apparatus. When performing lighting light check and the lighting is poor, the reason for poor lighting is the poor of panel or contact can be easily judged. The The present invention provides a check apparatus. When performing lighting light check and the lighting is poor, the reason for poor lighting is the poor of panel or contact can be easily judged. Thecheck apparatus checks the lighting of the check object panel. The check apparatus comprises multiple probe combinations with probes directly contacting with the electrodes of the check object panel acheck apparatus checks the lighting of the check object panel. The check apparatus comprises multiple probe combinations with probes directly contacting with the electrodes of the check object panel and a probe pedestal supporting the probe combinations, wherein the multiple probe combinations comprise a probe combination for simple contact, which simply contacts with the check object panel for sind a probe pedestal supporting the probe combinations, wherein the multiple probe combinations comprise a probe combination for simple contact, which simply contacts with the check object panel for simple lighting check, and a probe combination for all contact, which fully contacts with the check object panel for universal lighting check.mple lighting check, and a probe combination for all contact, which fully contacts with the check object panel for universal lighting check.

Description

technical field [0001] The present invention relates to an inspection device used for lighting inspection of inspection target panels such as liquid crystal panels. Background technique [0002] For example, in the manufacturing process of a liquid crystal panel (LCD panel), a lighting inspection is performed on a single LCD panel before entering an assembly process. This lighting inspection includes a normal lighting inspection and a simplified lighting inspection. [0003] Generally, a lighting inspection refers to a lighting inspection performed by bringing all probes into contact with each electrode of the LCD panel. The simple lighting inspection refers to a lighting inspection performed by a simple touch in which a probe is not brought into contact with all the electrodes of the LCD panel but partially touched. There is Patent Document 1 as an example of this simple lighting inspection. [0004] Patent Document 1: Japanese Patent Application Laid-Open No. 09-138422 ...

AI Technical Summary

Problems solved by technology

[0005] However, in the above-mentioned inspection device, when lighting failure occurs during the lighting inspection, it is necessary to replace the probe unit when it is determined whether the cause of the lighting failure is the panel or poor contact.

[0006] However, in the case of replacing the probe unit, since the work is complicated and time-consuming, there is a problem that the workability is poor and it is not easy to determine the cause of the failure.

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