Mechanical life test device

Abstract

The invention relates to a mechanical life test device, which is used for testing the mechanical life of a lock catch or a shearing stress loss structure of a workpiece. One end of the workpiece is provided with the lock catch, and the other end of the workpiece is provided with the shearing stress loss structure. The test device comprises a substrate, a workpiece mounting pad, a simulation device, a shearing stress simulation structure, a linkage swing stem device, a swing stem driving device, a pressure sensor, a first counter, a second counter and a control circuit; wherein the simulation device is matched with the lock catch to work; the shearing stress simulation structure is matched with the shearing stress loss structure to work; the linkage swing stem device makes the simulation device and the shearing stress simulation structure circularly work; the swing stem driving device drives the linkage swing stem device to move periodically; the pressure sensor senses the pressure of the workpiece; the first counter records the pressure loss times of the pressure sensor; the second counter records the rotating number of a cam; and the controller circuit receives and compares the counts of the first counter and the second counter, and controls a motor to rotate or stop rotating. When the device is used for testing, an operator only needs to start the test device; and after the motor stops rotating, the service life of the workpiece can be acquired through the second counter.

Description

technical field [0001] The invention relates to a testing device, in particular to a testing device for testing the mechanical life of a locking buckle or a shear stress loss structure on a workpiece. Background technique [0002] For a long time, manufacturers have to conduct strict mechanical performance tests on products before they are released to the market. This is related to the quality of products, so testing is very important. [0003] Currently active electronic products in the market, such as mobile phones, notebook computers and handheld game consoles, often adopt a structure combining a body and a cover. Since the cover needs to be frequently moved relative to the main body to open and close the electronic product, some structures on the cover will be damaged due to long-term use or wear, thereby affecting the service life of the cover. For example, figure 2 A mobile phone cover 1 (molded in one piece) is shown, one end of which is provided with a lock 12, and...

AI Technical Summary

Problems solved by technology

Since there is no mature relevant testing technology at present, the industry urgently needs a mechanical life testing equipment for testing the durability of this type of machinery.

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