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Automatic diagnostic method and equipment of parallel ports of embedded type equipment

An embedded device and automatic diagnosis technology, applied in the direction of measuring devices, instruments, electrical digital data processing, etc., can solve the problems of manned duty, insignificant function of embedded device interface, low coverage of interface pin test, etc., to improve test efficiency effect

Inactive Publication Date: 2011-07-27
FUJIAN CENTM INFORMATION
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] At present, the parallel port test methods used in embedded devices are all manually tested using simple test instruments, which cannot be done automatically and require someone to be on duty, and the coverage of each interface pin test is low, limited to data The receiving and sending signal test provides relatively simple test results, and does not play an obvious role in ensuring the quality of the embedded device interface.

Method used

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  • Automatic diagnostic method and equipment of parallel ports of embedded type equipment
  • Automatic diagnostic method and equipment of parallel ports of embedded type equipment
  • Automatic diagnostic method and equipment of parallel ports of embedded type equipment

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Experimental program
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Embodiment Construction

[0017] The parallel port of the embedded device under test in the present invention is a standard 25-core parallel port, wherein pin 1 is a strobe terminal (active at low level), pin 2 is data 0, pin 3 is data 1, pin 4 is data 2, and pin 4 is data 2. 5 is data 3, pin 6 is data 4, pin 7 is data 5, pin 8 is data 6, pin 9 is data 7, pin 10 is confirmed (active low), pin 11 is busy, pin 12 is out of paper, Pin 13 is select, pin 14 is word wrap, pin 15 is error, pin 16 is initialization, pin 17 is select input, pins 18 to 25 are ground.

[0018] see figure 1 As shown, its embedded device parallel port automatic diagnosis method is divided into the following steps:

[0019] start testing.

[0020] Step 1. Parallel port pin test: Connect the pins of the parallel port to each other to form four different loops. The four loops are: pin 1, pin 2, pin 6, and pin 13 to form a loop; pin 3 and pin 7 , pin 12 and pin 14 form a loop; pin 4, pin 8, pin 10 and pin 16 form a loop; pin 5, pin ...

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Abstract

The invention discloses an automatic diagnostic method of parallel ports of embedded type equipment, comprising the following steps: (1) stitches of parallel ports are tested, i.e. stitches of the parallel ports are mutually connected to form four different loop circuits, input stitches of each loop circuit send signals in turn, and stitches corresponding to the input stitches receive the corresponding signals to judge; (2) testing result of the stitches of each parallel port is displayed, and special testing equipment is designed aiming at the previous three main steps. The invention can automatically test the stitches of each parallel port without manpower, can test various types of parallel ports of the embedded type equipment and can effectively verify the stitches of each parallel port.

Description

【Technical field】 [0001] The invention relates to a method for automatically diagnosing a parallel port of an embedded device and a diagnostic device thereof, belonging to the field of testing of embedded devices. 【Background technique】 [0002] At present, the parallel port test methods used in embedded devices are all manually tested using simple test instruments, which cannot be done automatically and require someone to be on duty, and the coverage of each interface pin test is low, limited to data The receiving and sending signal test provided by the test is relatively simple, and it does not play an obvious role in ensuring the quality of the embedded device interface. 【Content of invention】 [0003] One of the technical problems to be solved by the present invention is to provide a parallel port automatic diagnosis method for embedded devices, to realize the automatic operation of the parallel port test of embedded devices, and to ensure that each pin of each interfa...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/267G01R31/3185
Inventor 蔡国凤张辉
Owner FUJIAN CENTM INFORMATION