Custom curved surface test report system and custom surface test report method

A testing report and self-defined technology, which can be used in measuring devices, image data processing, special data processing applications, etc., and can solve the problems of large data and waste of paper in curved surface testing reports.

Inactive Publication Date: 2009-11-25
HONG FU JIN PRECISION IND (SHENZHEN) CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

As the standard surface modeling of products becomes more and more complex, such as mobile phones, MP3, and MP4, the data in the surface inspection reports obtained is very large, and the printing method not only wastes a lot of paper, but also customers cannot operate on the generated surface inspection reports ( Such as adding a label, querying the deviation value of a certain area, looking at the graphs compared in the surface inspection report from different angles, etc.)

Method used

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  • Custom curved surface test report system and custom surface test report method
  • Custom curved surface test report system and custom surface test report method
  • Custom curved surface test report system and custom surface test report method

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Embodiment Construction

[0011] Such as figure 1 Shown is a hardware architecture diagram of a preferred embodiment of the computer system for customizing the surface detection report of the present invention. The computer system mainly includes a monitor 1 , a host 2 , a keyboard 3 and a mouse 4 .

[0012] The host 2 is used for storing the curved surface detection report of the object. The surface detection report is mainly composed of a standard CAD standard surface (hereinafter referred to as the standard surface), actual point cloud data obtained by scanning the object, contour data of the standard surface and view matrix data, and the standard surface is composed of triangular mesh data. The curved surface detection report also includes the model of the object, the date of report generation and the labeled label information (such as: indicate the deviation range of the area, the deviation value and other information in the area with relatively large deviation of the standard curved surface). T...

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Abstract

The invention discloses a custom curved surface test report method, which comprises the following steps: setting tolerance information, color information and visual angle matrix data to determine the direction, position and angle in a coordinate of a graph formed by an actual point cloud and a standard curved surface; reading actual point cloud data; reading the shortest distances from the points in the point cloud to the standard curved surface as well as the trimesh data of the standard curved surface, and acquiring the color of a corresponding triangle of each point according to a tolerance range of the shortest distances from the points in the point cloud to the standard curved surface; reading the profile line of the standard curved surface in a curved surface test report; and displaying the read data information to create a customer-defined curved surface test report.

Description

technical field [0001] The invention relates to a self-defined curved surface detection report system and method. Background technique [0002] In recent years, with the improvement of computer hardware performance and the reduction of price, three-coordinate measuring machine is a kind of measuring device widely used in industry and scientific research to measure products. The general measurement method is to place the measured object on the In the three-coordinate measurement space, the contact probe of the three-coordinate measuring machine is used to capture data point by point along the programmed path on the surface of the measured object, analyze the quality of the standard surface of the measured object according to the captured data, and then generate a surface inspection report. Usually, the surface detection report consists of standard CAD standard surface, actual point cloud data obtained by scanning the object, contour data of the standard surface and view matri...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50G01B21/00
CPCG06T2219/2012G06T19/00G06T17/20G06T19/20
Inventor 张旨光吴新元孙小超胡金波
Owner HONG FU JIN PRECISION IND (SHENZHEN) CO LTD
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