Method for modeling variable section beam in micro-electronic-mechanical system (MEMS) level design
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- 南通升辉建材科技有限公司
- Publication Date
- 2011-11-16
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention relates to a variable-section beam modeling method in micro-electro-mechanical system (MEMS) system-level design, and belongs to the field of micro-electro-mechanical system design. Background technique
[0002] In the MEMS structure, in order to achieve some design goals of the beam, such as small stress concentration, small size, high strength, light weight, good stability, etc., and considering the change of the bending moment of the beam along the axis, the width is often used Variable-section beams that vary linearly with length replace conventional constant-section beams to optimize the structure. For example, in inertial devices such as micro-accelerometers and micro-mechanical gyroscopes, the bending moment borne by most cantilever beams changes along its axial direction, so it is necessary to ensure that the free end of the cantilever beam structure has a small stiffness to generate a large bending moment. The deformation of the...