Accelerated degradation test method of multistage separation type dynode electron multiplier

Abstract

The invention discloses an accelerated degradation test method of a multistage separation type dynode electron multiplier, which comprises the following steps: 1) placing at least five electron multiplier samples in a sealed container with binding posts, connecting electrodes of the electron multipliers with the corresponding binding posts, pumping the sealed container and maintaining vacuum; 2) respectively imposing at least three groups of incident particle flow strengths and working voltage values with different levels but higher than the normal using level on all the electron multiplier samples; 3) utilizing a milli-ampere current meter for carrying out continuous monitoring on the output current of all the electron multipliers; dividing the output current by the incident particle flow strength, converting into gain data and recording; and 4) utilizing a computer for processing the recorded gain data of the electron multipliers, and obtaining the predicted result of the service life.

Description

technical field [0001] The invention belongs to the technical field of accelerated testing of electric vacuum devices, and in particular relates to a method for evaluating the electron multiplier by monitoring and analyzing the gain data information of a multi-stage separated dynode electron multiplier (hereinafter referred to as the electron multiplier) under accelerated conditions. An accelerated test method for the life time of the device under actual use conditions. Background technique [0002] Electron multipliers are vacuum electronic devices that are widely used in atomic frequency standards, low-light night vision, nuclear detection, mass spectrometry, medical X-ray imaging and other fields, and are the core basic devices that restrict the development of technologies in related fields. Electron multiplier life is usually defined as the working time when its gain drops to a certain threshold under normal working conditions, which is a typical performance degradation ...

AI Technical Summary

Problems solved by technology

At present, the accelerated degradation test has been applied in the performance degradation life prediction of light-emitting diodes, logic integrated circuits, power supplies, insulators, and pharmaceuticals, but there is no research report on the accelerated degradation test method of electron multipliers.

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