Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

FPGA controller special for defect detection of knitted fabrics

A detection control system, knitted fabric technology, applied in the program control of sequence/logic controller, electrical program control, etc.

Inactive Publication Date: 2011-04-13
JIANGNAN UNIV
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, after using digital image processing technology to complete the defect detection of warp knitted fabrics, there is no clear solution on how to identify the defects and perform preliminary processing.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • FPGA controller special for defect detection of knitted fabrics
  • FPGA controller special for defect detection of knitted fabrics
  • FPGA controller special for defect detection of knitted fabrics

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0016] The entire warp-knitted fabric defect detection controller is mainly composed of FPGAMUL501 system, and the warp-knitted fabric defect detection processor is mainly composed of EFPGAMUL501, memory, communication interface and keyboard display, which are used to receive, store and process warp-knitted Knitted fabric defect data, the composition block diagram is as follows figure 2 shown. When the warp-knitted fabric defect data is changed, the system microcomputer is used to input the defect data through the RS232 interface and stored in the warp-knitted fabric defect processor.

[0017] Warp knitted fabric defect memory is used to store defect data; keyboard and display are used to input warp knitted fabric structural parameters and other working parameters; RS-232 serial communication interface receives defect data transmitted from host computer; FPGA system is responsible for the entire Operational control and data processing of the defect processor.

[0018] The e...

example 2

[0021] The entire warp knitted fabric defect detection controller is mainly composed of FPGA Altera system, and the fabric defect processor is mainly composed of FPGA Altera system, storage body, communication interface and keyboard display, etc., which are used to receive, store and process fabric defect data during work , forming a block diagram such as Figure 4 shown. When the fabric defect data is changed, the processed fabric defect data is stored in the U disk, and the fabric defect data of the U disk is read into the memory of the fabric defect processor through the USB interface.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a field programmable gate array (FPGA) controller special for defect detection of knitted fabrics, and belongs to the field of novel textile machinery. The defects of the knitted fabrics are various, and the detection algorithm is complex, so specific defect processing flows need selecting according to the categories and related characteristics of the defects during detecting the defects, and a simple single software processing method obviously cannot meet the real-time control requirement of the defect detection. In order to solve the technical problem, an FPGA is used as the core of a control system, the FPGA system reads the categories and related characteristics of the defects, and the FPGA system controls the subsequent knitted fabric defect processing flows to meet the real-time control requirement of the defect detection and processing so as to finish the processing flows of the defects of the knitted fabrics.

Description

technical field [0001] The invention relates to the development of a special control system for warp-knitted fabric defect detection with the FPGA system as the core, and specifically relates to using the FPGA system to read warp-knitted fabric defect types and related characteristic data and store the information in the memory, and use the data to control the step in real time. The action of the motor can realize the control of the defect detection and processing mechanism, so as to achieve the effect of real-time processing of defects. Background technique [0002] In the production process of warp knitted fabrics, due to the yarn and weaving process, defects such as slubs, missing warps, missing wefts, holes, and oil stains will be formed on the cloth surface. After the production of warp knitted fabrics is completed, the computer digital image processing technology can be used to locate the fabric defects and extract the characteristic parameters of the fabric defects to...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G05B19/05
Inventor 刘基宏潘如如王鸿博高卫东刘建立
Owner JIANGNAN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com