Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

SOC controller special for detecting yarn appearance parameters

A parameter detection and controller technology, which is applied to the program control and electrical program control of the sequence/logic controller, and can solve the problem of inaccurate detection of yarn appearance parameters.

Inactive Publication Date: 2011-04-20
JIANGNAN UNIV
View PDF0 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Using manual adjustment of these mechanisms requires professional training, and the adjustment results of different inspectors may be different, resulting in inaccurate detection of yarn appearance parameters

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • SOC controller special for detecting yarn appearance parameters
  • SOC controller special for detecting yarn appearance parameters
  • SOC controller special for detecting yarn appearance parameters

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0016] The entire yarn appearance parameter detection controller is mainly composed of Infineon TriCore system, and the yarn appearance parameter detection processor is mainly composed of Infineon TriCore, memory, communication interface and keyboard display, etc., which are used to receive, store and process yarn during work Appearance parameter data, the composition block diagram is as follows figure 2 shown. When the yarn appearance parameter data is changed, the system microcomputer is used to input the yarn appearance parameter data through the RS232 interface and store it in the yarn appearance parameter processor.

[0017] The yarn appearance parameter memory is used to store the yarn appearance parameter data; the keyboard and display are used to input the yarn appearance parameter type parameters and other working parameters; the RS-232 serial communication interface receives the yarn appearance parameter data transmitted from the host computer ; Infineon TriCore sy...

example 2

[0021] The entire yarn appearance parameter detection controller is mainly composed of Freescale M-Core system, and the yarn appearance parameter detection processor is mainly composed of FreescaleM-Core, storage body, communication interface and keyboard display, etc. Process the yarn appearance parameter data, the composition block diagram is shown in Figure 5. When the yarn appearance parameter data is changed, the processed yarn appearance parameter data is stored in the U disk, and the yarn appearance parameter data of the U disk is read into the memory of the yarn appearance parameter detection processor through the USB interface.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a system on a chip (SOC) controller special for detecting yarn appearance parameters and belongs to the field of novel textile machinery. The types of the yarn appearance parameters are multiple, and the yarn movement velocity, the types of detecting heads and the distance between the detecting head and the yarn are different when different yarn appearance parameters are detected, so when the yarn appearance parameters are detected, a specific detecting flow is selected according to the types of the yarn appearance parameters need detecting, and the real-time control requirement of the yarn appearance parameters cannot be met by a simple and unique software processing method obviously. In order to solve the problem, the SOC controller takes an SOC controller system as a core of a control system, the SOC controller reads in the yarn appearance parameters and related characteristics, and the SOC controller system controls the subsequent processing flow of detecting the yarn appearance parameters to meet the real-time control requirement of processing of the yarn appearance parameters and complete the processing flow of detecting the yarn appearance parameters.

Description

technical field [0001] The invention relates to the development of a special control system for yarn appearance parameter detection with the SOC system as the core, and specifically relates to using the SOC to read the types of yarn appearance parameters and related characteristic data, store the information in the memory, and use the data to control the action of the stepping motor in real time Therefore, the control of the yarn appearance parameter detection and processing mechanism is realized, so as to achieve the effect of real-time processing of the yarn appearance parameter detection. Background technique [0002] After yarn production, it is necessary to evaluate the yarn quality. The commonly used standard for yarn quality evaluation is the appearance parameters of the yarn. Therefore, it is necessary to complete the detection of the yarn appearance parameters, so as to evaluate the yarn quality grade. Similarly, when yarn production is carried out according to inco...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G05B19/04
Inventor 刘基宏潘如如王鸿博高卫东刘建立
Owner JIANGNAN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com