Observation test device for mesoscopic and microscopic mechanical property and deformation of tailings
A test device and a technology for observing mechanics, which can be used in measuring devices, using stable tension/pressure to test the strength of materials, scientific instruments, etc.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0030] Below in conjunction with accompanying drawing and embodiment the present invention will be further described:
[0031] Such as figure 1 , 2 As shown, a tailings microscopic mechanical and deformation observation test device includes a pressure chamber 2 fixed on the base 1, and a pressurizing piston 3 extending from the mouth of the pressure chamber 2 into the pressure chamber 2, and The pressurizing piston 3 is tightly matched with the pressure chamber 2, and a pressure chamber is formed in the pressure chamber 2. The key is that: the side wall of the pressure chamber 2 is provided with an observation window 2a, and the inner wall of the pressure chamber 2 is provided with a ring for installation Groove, transparent observation tube 4 is installed in this mounting groove.
[0032] Using an electron microscope, the deformation of the microstructure of the tailings in the pressure chamber under pressure can be observed through the observation window 2a.
[0033] The ...
PUM
![No PUM](https://static-eureka.patsnap.com/ssr/23.2.0/_nuxt/noPUMSmall.5c5f49c7.png)
Abstract
Description
Claims
Application Information
![application no application](https://static-eureka.patsnap.com/ssr/23.2.0/_nuxt/application.06fe782c.png)
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com