Method for detecting highlight flaw of polaroid and threshold value generating method and device
A detection device and defect detection technology, applied to measuring devices, material analysis through optical means, instruments, etc., can solve the problems of increased test cost, glare, and more working hours, so as to prevent secondary artificial injuries, reduce the number of times, The effect of reducing the time for manual visual inspection
Inactive Publication Date: 2011-08-17
BENQ MATERIALS +1
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[0003] However, the existing detection method is to calculate the average brightness of each point to be measured, and judge whether the average brightness is greater than a threshold value, if so, it is judged as a bright spot defect; otherwise, it is judged as a glare
This detection method will misjudge some glares that are brighter than bright spot defects as bright spot defects, so that subsequent product inspectors will spend too much working time and increase the cost of testing when performing manual visual inspection
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[0031] The foregoing and other technical contents, features and effects of the present invention will be clearly presented in the following detailed description of the two embodiments with reference to the drawings.
[0032] refer to figure 1 and figure 2 , figure 1 It is the first embodiment of the detection device 100 of the present invention. The detection device 100 is mainly used to detect a plurality of points 210 to be measured on a polarizer 200, and to detect that there are Which are the real flaws belonging to the polarizer 200 itself, which are called bright spots (bright spot) 10, and which spots 210 to be tested are caused by the release film (not shown) attached to the polarizer 200 The reflected light is called glare (glare) 20 , that is, the defect (false defect) of the non-polarizer 200 itself.
[0033] In this embodiment, the detection device 100 includes a sampling unit 1 , a grayscale value calculation unit 2 , an evaluation value generation unit 3 , a ...
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The invention provides a method for detecting a highlight flaw of a polaroid and a threshold value generating method and device. The method for detecting the highlight flaw of the polaroid is executed in a detecting device, and the polaroid is provided with at least one point to be detected; and the method for detecting the highlight flaw comprises the following steps of: (A) sampling in a detection area including the point to be detected; (B) calculating an image gray-scale value in the detection area; (C) generating an evaluation value capable of representing gray-scale variation degree of the detection area according to the image gray-scale value; and (D) comparing the evaluation value with a threshold value to detect whether the point to be detected is the highlight flaw or not. Therefore, by means of the method for detecting the highlight flaw, a manual visual inspection time can be reduced for inspectors of follow-up finished products.
Description
technical field [0001] The invention relates to an automatic optical detection method, in particular to a detection method for bright spot defects on polarizers. Background technique [0002] After the polarizer is produced, the Automated Optical Inspection (AOI) system will be used to detect bright spot defects. The AOI system uses optical methods to obtain the surface image of the polarizer, and then Using image processing technology to judge bright spot defects on polarizers, and mark all possible bright spot defects as points to be tested for subsequent final quality control (FQC) inspection by manual visual inspection determination. However, in order to prevent any bright spot defect from being detected, the automatic optical inspection system will overkill, that is, the glare (glare) caused by the release film (not shown) attached to the polarizer. ) are misjudged as bright spot defects, so that these marked points to be tested will include real bright spot defects a...
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IPC IPC(8): G01N21/958
Inventor 赵新民
Owner BENQ MATERIALS