Testing software in electronic device

A technology of electronic equipment and software, which is applied in the field of testing software in electronic equipment, and can solve problems such as difficulties

Active Publication Date: 2011-11-02
MICROSOFT TECH LICENSING LLC
View PDF2 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, testing a device with software from various sources to identify problems can be difficult

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Testing software in electronic device
  • Testing software in electronic device
  • Testing software in electronic device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0023] Disclosed below are examples of testing techniques and / or related systems and methods. The examples should in no way be construed as limiting. Rather, the invention is directed to all novel and non-obvious features and aspects of each of the disclosed methods and systems and their equivalents, alone or in various combinations and subcombinations with each other. The methods disclosed here are not only executed in the human mind.

[0024] As used in this application and the claims, the singular forms "a", "an" and "the" include plural referents unless the context clearly dictates otherwise. Additionally, the term "comprises" means "open-ended inclusion." When the phrase "and / or" is used in a sentence, it can mean "one or more" of the elements described in the sentence. The embodiments described herein are exemplary embodiments of the disclosed technology unless expressly stated otherwise.

[0025] Although the operations of some of the disclosed methods and systems a...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

Software in an electronic device can be tested using a combination of random testing and deterministic testing. In various embodiments, deterministic tests can run for a prescribed duration and / or a prescribed number of iterations before and / or after random testing. Test results can be weighted using a metric representing an amount of code that was stressed during testing. This metric can be determined by tracking software code that is loaded into memory during testing.

Description

technical field [0001] The disclosed technology relates to testing of software, such as that of an electronic device. Background technique [0002] Electronic devices often use software developed by multiple parties. For example, an operating system or drivers may be developed by a first company, while applications may be developed by a second company. Portions of software developed by different companies may have compatibility issues. However, testing a device with software from various sources to identify problems can be difficult. For example, instrumented builds for some or all software are not available in at least some cases. Contents of the invention [0003] Software within electronic devices may be tested using a combination of random and deterministic testing. In various embodiments, a deterministic test may be run for a specified duration and / or for a specified number of iterations before and / or after the random test. Test results may be weighted using a me...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG06F11/3676
Inventor S·拉贾什卡拉R·坎K·薛P·孙达拉莫西G·E·恩斯特龙E·R·斯塔夫鲁
Owner MICROSOFT TECH LICENSING LLC
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap