38 results about "Deterministic testing" patented technology

Software in an electronic device can be tested using a combination of random testing and deterministic testing. In various embodiments, deterministic tests can run for a prescribed duration and / or a prescribed number of iterations before and / or after random testing. Test results can be weighted using a metric representing an amount of code that was stressed during testing. This metric can be determined by tracking software code that is loaded into memory during testing.

A digital system having multiple clock domain, each including at least one edge-triggered device, such as a flip-flop, is structured to be submitted to scan testing. Each data path from one clock domain to another includes a latch that is operated by a test clock. During scan testing, when the digital system is logically reconfigured to form one or more scan chains for receiving a test vector, the latches are operated to ensure that the test vector is passed from one domain to another.

Precise estimation of latency is attained based on identifying that a receive clock is configured to operate only at prescribed available frequencies. A receive buffer circuit includes buffer control logic configured for reading a selected number of the buffer entries based on a detected number of receive clock edges within one local clock cycle. Valid data is identified based on the number of clock edges exceeding a selected threshold. A selected pointer offset is obtained from a lookahead table, specifying multiple pointer offsets for accommodating latency encountered at respective prescribed available frequencies, based on matching the determined frequency to one of the prescribed available frequencies. The selected pointer offset is added to a read pointer to offset the latency encountered from edge detection.

In one embodiment, an IC with an embedded processor core, peripheral devices, and associated multiple scan chains, is provided with microcode that implements an arithmetic pseudo-random number generator and an arithmetic deterministic test vector generator, when executed by the embedded processor core, generates 2-D pseudo-random and deterministic test vectors for testing the peripheral devices respectively. The IC is further provided with microcode that implements an arithmetic test response compactor, which when executed by the embedded processor core, compacts test responses of the peripheral devices into a signature. The IC further includes a test port register and microcode that implements a number of ABIST instructions.

A method and a system for generating prime numbers and testing for primality of an integer. This invention has applicability to “public key” and other encryption techniques that play an important role in the security of information technology and electronic commerce. Generation of prime numbers requires the step of testing the primality. The method includes a deterministic test for testing the primality of a number in polynomial time. The system comprises a random number generator and a primality tester. The random number generator generates a random number and the primality tester tests the primality of this random number. The primality tester can also be used independent of the random number generator. In such a case, the number whose primality is to be tested can be input via a user interface.

The invention relates to a method for compressing the test data of integrated circuit, belonging to integrated circuit technical field, in particular to a deterministic self-test test data compressor. The invention comprises a phase shifter, a response compressor, a linear feedback shift register with a first and a second xor network while the shift register is connected with the phase shift, a scanning tree and a weigh random signal generating logic unit while the scan forest is connected with the phase shift, the gating signal end of the scan forest is connected with the weight random signal generating logic unit, and the output of the scan forest is connected with the response compressor. The invention further provides a deterministic self-test test data compression method. The invention uses the weight random signal generating logic unit to control the frequency of special signal of the input signal of the scan forest, to improve the fault coverage rate into the false random self-test process, to reduce the test data memory space generated by deterministic test vector.

Test patterns for at-speed scan tests are generated by filling unspecified bits of test cubes with functional background data. Functional background data are scan cell values observed when switching activity of the circuit under test is near a steady state. Hardware implementations in EDT (embedded deterministic test) environment are also disclosed.

A test apparatus is configured to perform non-determinative testing of equipment. The test apparatus comprises a test computer arranged to automatically execute a non determinative test regime under the control of a test application. A network simulator connected to the test computer is provided with communication circuitry operable to communicate with the equipment under test. The network simulator is configurable into different network states according to the non-determinative test regime, and the test application is operable to control the network simulator to transition between a plurality of different network states. Data about unscripted communications between the network simulator and the equipment under test is monitored and can be analyzed to reach a test verdict.

A method and system for testing packet error rate in electronic devices by transmitting a series of data packets from a testing device to a device under test (DUT) and setting a predefined number of received error-free data packets; evaluating whether a number of data packets from the series of data packets received error-free by the DUT equals the predefined number of received error-free data packets and transmitting additional data packets from the testing device to the DUT, at a power level known to produce zero received-packet errors in a correctly operating DUT, if the number of data packets from the series of data packets received error-free by the DUT does not equal the predefined number of received error-free data packets. Additional possible embodiments include evaluating whether a total number of data packets from the series of data packets and the additional error-free-power-level data packets received error-free by the DUT equals the predefined number of received error-free data packets and transmitting a confirmation data packet to the testing device in response to reception by the DUT of the predefined number of received error-free data packets.

An apparatus for generating a deterministic test pattern is provided for a BIST having a scan chain, comprising the control bits storing devise for storing the number of a deterministic test pattern that is covered by a tap configuration; pattern counter devise for receiving the values stored in the control bits storing devise one by one and then counting the values backward; configuration counter devise for tracing the order of a current tap configuration and incrementing the order by 1 whenever the value of the pattern counter passes through 1; a decoder for constituting a phase shifting network depending on the value of the configuration counter devise and determining an input signal of an XOR gate depending on TapConni(j); and a reconfigurable phase shifter for receiving the input signal from the decoder to constitute an actual phase shifter.

A method, apparatus and computer program product are provided for implementing deterministic based broken scan chain diagnostics. A deterministic test pattern is generated and is loaded into each scan chain in the device under test using lateral insertion via system data ports applying system clocks. Then each scan chain is unloaded and a last switching latch is identified. The testing steps are repeated a selected number of times. Then checking for consistent results is performed. When consistent results are identified, then the identified last switching latch is sent to a Physical Failure Analysis system.

The invention discloses a re-sowing test plan based on a parallel folding counter; the re-sowing test plan is characterized in that a test set is doubly compressed by a linear feedback shifting register (LFSR) and a folding counter code; a tested circuit moved into a multi-scan link structure in parallel by a phase shifter and a parallel folding control circuit in the test process completes the test function. In the plan of the invention, the circuit scanning structure is not changed, and the original mono-scan serial input is transformed to be multi-scan parallel input which is suitable for a plurality of test modes like random test mode, deterministic test and mixed test mode and the like; the test data storage volumes needed by tests are reduced, and the test time is greatly saved.

Disclosed below are representative embodiments of methods, apparatus, and systems used to generate test patterns for testing integrated circuits. Embodiments of the disclosed technology can be used to provide a low power test scheme and can be integrated with a variety of compression hardware architectures (e.g., an embedded deterministic test (“EDT”) environment). Certain embodiments of the disclosed technology can reduce the switching rates, and thus the power dissipation, in scan chains with no hardware modification. Other embodiments use specialized decompression hardware and compression techniques to achieve low power testing.

The invention relates to a comprehensive energy system energy use flexibility evaluation method and system. The method comprises the following steps: S1, establishing a comprehensive energy system mapping model based on physical characteristics of energy equipment and an energy network topology structure; s2, according to the historical operation data of the comprehensive energy system and the historical load data in the supply area, establishing an uncertainty test set of the supply end and the demand end, and generating energy demand and energy supply pairs of the demand end under all the test sets; s3, calculating the flexibility of different energy flows according to the generated energy demand and energy supply pair; and S4, determining the overall energy use flexibility of the comprehensive energy system based on a fuzzy analytic hierarchy process. According to the method, guidance can be provided for energy gradient utilization and operation scheduling optimization of the comprehensive energy system, interaction between the supply end and the demand end is enhanced, and adverse effects caused by system uncertainty are reduced.

The object is to develop an integrated circuit arrangement (100) with at least one application circuit (40) to be tested. In addition, with at least one self-test circuit (10, 20, 32, 34, 36, 50) provided for testing the application circuit (40) and generating at least one pseudo-random test sample, wherein the said pseudo-random test sample can be converted into at least one test vector that is programmable and / or deterministic. Moreover, that can be supplied to the application circuit (40) for testing purposes via at least one logic gate (32, 34, 36). And by means of at least one signal that can be applied to said logic gate (32, 34, 36), and wherein the output signal arising in dependence on the deterministic test vector can be evaluated by the application circuit (40) by means of at least one signature register (50). As well as a method of testing the application circuit (40) present in the integrated circuit arrangement (100) by means of the self-test circuit (10, 20, 32, 34, 36, 50) further such that the BIST [build in self test] hardware connected to the additional deterministic logic can be reduced. It is suggested that the signal to be supplied to the logic gate (32, 34, 36) can be made available by a BFF [bit flipping function] logic circuit (10) based on at least one.

Software in an electronic device can be tested using a combination of random testing and deterministic testing. In various embodiments, deterministic tests can run for a prescribed duration and / or a prescribed number of iterations before and / or after random testing. Test results can be weighted using a metric representing an amount of code that was stressed during testing. This metric can be determined by tracking software code that is loaded into memory during testing.

The uncertainty fault diagnosis efficiency evaluation method for the complex electronic system is high in automation degree and accurate in conclusion, and the average diagnosis step number and the diagnosis cost can be reduced. According to the technical scheme, the method comprises the steps that an electronic system hierarchical framework, an FMEA result and a test point scheme serve as input, and an uncertainty fault-test dependency matrix (D matrix) of a system is constructed for three test types of absolute test, non-absolute test and uncertainty test; then, the influence of non-absolute testing on the detectable fault mode set is eliminated, and a fault detection rate index is calculated; then, the influence of non-absolute testing on the detectable fault mode set is eliminated, and a fault detection rate index is calculated; next, the influence of uncertainty on the isolatable fault mode set is eliminated, and the fault mode set isolated to 1, 2 and 3 external field replaceable units or modules (LRU / LRM) and a fault isolation rate index are obtained;.

A method and system for built-in self-testing for high-performance circuits, configured to generate and apply a test pattern to a circuit under test (CUT). A logic structure in communication with the CUT and a memory device generates a plurality of test seeds from a plurality of original test seeds, the generated test seeds and original test seeds defining a total test seed plurality and a subset deterministic test pattern plurality. A response suppression circuit suppresses test responses from the CUT if not generated responsive to a deterministic test seed of the deterministic test pattern plurality.

Built-in test equipment (BITE) incorporated in a GPS receiver for providing a loop forward test. The loop forward test capability may be combined with a loop backward capability to provide a comprehensive built-in test (BIT) capability for the signal path in a GPS receiver. A code generator generates deterministic test code signals such as C / A code, P code and pseudo M code that are used to modulate one or more radio frequency (RF) carriers to produce RF test signals. The RF test signals are injected into the GPS receiver's RF input. The RF test signal signals are then down-converted and demodulated through an operational signal path of the GPS receiver. The processed test signals may then be compared to the initial test data. A loop backward BITE may also be used to sample the positioning data output by the receiver.

The object being to develop an integrated circuit arrangement (100) with at least one application circuit (40) to be tested, and with at least one self-test circuit (10, 20, 32, 34, 36, 50) provided for testing the application circuit (40) and generating at least one pseudo-random test sample, wherein said pseudo-random test sample can be converted into at least one test vector that is programmable and / or deterministic and that can be supplied to the application circuit (40) for testing purposes via at least one logic gate (32, 34, 36) and by means of at least one signal that can be applied to said logic gate (32, 34, 36), and wherein the output signal arising in dependence on the deterministic test vector can be evaluated by the application circuit (40) by means of at least one signature register (50), as well as a method of testing the application circuit (40) present in the integrated circuit arrangement (100) by means of the self-test circuit (10, 20, 32, 34, 36, 50) further such that the B[uild-]I[n]S[elf-]T[est] hardware connected to the additional deterministic logic can be reduced, it is suggested that the signal to be supplied to the logic gate (32, 34, 36) can be made available by a B[it]F[lipping]F[unction] logic circuit (10) based on at least one

A method, apparatus and computer program product are provided for implementing deterministic based broken scan chain diagnostics. A deterministic test pattern is generated and is loaded into each scan chain in the device under test using lateral insertion via system data ports applying system clocks. Then each scan chain is unloaded and a last switching latch is identified. The testing steps are repeated a selected number of times. Then checking for consistent results is performed. When consistent results are identified, then the identified last switching latch is sent to a Physical Failure Analysis system.

The invention relates to the technical field of large-scale digital integrated circuits, and provides a low-power-consumption certainty BIST based on single and double jump and a seed compression method thereof. In order to reduce test power consumption, a novel single and double jump unit and an ROM control signal are applied to generate a certainty seed through single and double hybrid jump, and then certainty test vectors are generated by utilizing a single jump reseeding technology. Meanwhile, the generation number of the certainty test vectors in the reseeding process is constrained by additional arrangement of a 2-bit subtracting counter so as to reduce the number of redundant vectors and reduce test time. Besides, the corresponding seed compression method is also put forward so as to compress area overhead and generate the control signal. The experiment result proves that the test performance, such as test time, the area overhead and test power consumption, of the BIST and the seed compression method can be reduced to a large extent.

A novel decompressor / PRPG on a microchip performs both pseudo-random test pattern generation and decompression of deterministic test patterns for a circuit-under-test on the chip. The decompressor / PRPG has two phases of operation. In a pseudo-random phase, the decompressor / PRPG generates pseudo-random test patterns that are applied to scan chains within the circuit-under test. In a deterministic phase, compressed deterministic test patterns from an external tester are applied to the decompressor / PRPG. The patterns are decompressed as they are clocked through the decompressor / PRPG into the scan chains. The decompressor / PRPG thus provides much better fault coverage than a simple PRPG, but without the cost of a complete set of fully-specified deterministic test patterns.

Systems and methods for a deterministic automatic test generation (ATPG) process including Timing Exception ATPG (TEA). A method includes performing an automated test pattern generation (ATPG) process that uses timing exception information to generate a test pattern for a targeted fault of a circuit design with at least one timing exception path. The method includes testing the targeted fault of the circuit design using the test pattern to produce a test result for the targeted fault.

A method and system for built-in self-testing for high-performance circuits, configured to generate and apply a test pattern to a circuit under test (CUT). A logic structure in communication with the CUT and a memory device generates a plurality of test seeds from a plurality of original test seeds, the generated test seeds and original test seeds defining a total test seed plurality and a subset deterministic test pattern plurality. A response suppression circuit suppresses test responses from the CUT if not generated responsive to a deterministic test seed of the deterministic test pattern plurality.

The invention relates to a method for compressing the test data of integrated circuit, belonging to integrated circuit technical field, in particular to a deterministic self-test test data compressor.The invention comprises a phase shifter, a response compressor, a linear feedback shift register with a first and a second xor network while the shift register is connected with the phase shift, a scanning tree and a weigh random signal generating logic unit while the scan forest is connected with the phase shift, the gating signal end of the scan forest is connected with the weight random signalgenerating logic unit, and the output of the scan forest is connected with the response compressor. The invention further provides a deterministic self-test test data compression method. The invention uses the weight random signal generating logic unit to control the frequency of special signal of the input signal of the scan forest, to improve the fault coverage rate into the false random self-test process, to reduce the test data memory space generated by deterministic test vector.

The present invention discloses a system and method for deterministically testing the packet error rate in electronic equipment, including: transmitting a series of data packets from the test equipment to the device under test (DUT) and setting the error-free data packets received a predetermined number; assessing whether the number of data packets received by the DUT without error in a series of data packets is equal to the predetermined number of error-free data packets received; and if not equal to the predetermined number of error-free data packets received, it will have Additional packets are transmitted from the test equipment to the DUT at a power level that produces zero received packet errors in a correctly functioning DUT. Other possible embodiments include evaluating whether the total number of data packets received without error by the DUT in a series of data packets and additional error-free power level data packets is equal to a predetermined number of received error-free data packets; and in response to the DUT receiving Upon said predetermined number of error-free data packets received, an acknowledgment packet is sent to the test device.