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Charged particle beam irradiation control device and charged particle beam irradiation method

A charged particle beam and irradiation control technology, which is applied in X-ray/γ-ray/particle irradiation therapy, etc., can solve problems such as uneven irradiation area, difficult switching, beam instability, etc.

Inactive Publication Date: 2015-04-08
NAT CANCER CENT +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

like Figure 8 As shown, since the rise of the arc discharge is unstable, the beam emitted from the accelerator is similarly unstable, and as a result, there is a possibility that it may become an uneven irradiation area.
[0005] Furthermore, in the prior art described in the above-mentioned Patent Document 1, since the switching between the irradiation state and the non-irradiating state of the beam is performed by mechanically opening and closing the shutter, there is a problem that switching at high speed is difficult.

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  • Charged particle beam irradiation control device and charged particle beam irradiation method
  • Charged particle beam irradiation control device and charged particle beam irradiation method
  • Charged particle beam irradiation control device and charged particle beam irradiation method

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Embodiment Construction

[0024] Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the drawings. In addition, in the following description, the same code|symbol is attached|subjected to the same or equivalent element, and repeated description is abbreviate|omitted.

[0025] A charged particle beam irradiation device according to an embodiment of the present invention will be described. figure 1 It is a perspective view showing a part of the charged particle beam irradiation device according to the embodiment of the present invention, figure 2 Yes figure 1 A schematic diagram of the charged particle beam irradiation device. figure 1 The illustrated charged particle beam irradiation apparatus 1 is an apparatus according to the scanning method, is mounted on a rotary table 12 provided to surround a treatment table 11 , and can be rotated around the treatment table 11 by the rotary table 12 . In addition, although figure 1 Although not shown,...

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Abstract

The invention provides a charged particle beam irradiation control device and a charged particle beam irradiation method, and aims to achieve high-speed changing of irradiation state / non-irradiation state of charged particle beams and stability of ejected charged particle beams. Accelerating voltage of the charged particle beams in the irradiation state is set as reference accelerating voltage, the accelerating voltage is changed into set accelerating voltage higher or lower than the reference accelerating voltage, and accordingly a track of the charged particle beams is changed, and the charged particle beams (R0) is changed into the non-irradiation state as the charged particle beams (R0) collide with other objects. The non-irradiation state of the charged particle beams can be obtained only by more highly or lowly changing the accelerating voltage, and accordingly high speed in changing of the irradiation state / the non-irradiation state can be realized. Further, on / off of arc discharge of an ion source (21) is not needed, and accordingly affection by instability of arc discharge in rising is avoided, and stability of the charged particle beams can be achieved.

Description

technical field [0001] The invention relates to a charged particle beam irradiation control device and a charged particle beam irradiation method. Background technique [0002] For example, in an accelerator equipped with an internal ion source such as a cyclotron, switching of an irradiation state / non-irradiation state of a beam (charged particle beam) is performed by ON / OFF control of arc discharge of the ion source. In addition, conventionally, as a device for blocking the beam of a cyclotron, there is a technology described in Patent Document 1, for example. In the beam interrupting device described in Patent Document 1, in an internal ion source type cyclotron, a beam is interrupted by moving a shutter disposed near the internal ion source to a beam trajectory. [0003] Patent Document 1: Japanese Patent Laid-Open No. 2002-25797 [0004] Figure 8 It is a graph showing an example of the beam current when an arc discharge is generated and rises in the internal ion sour...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): A61N5/10
Inventor 西尾祯治立川敏树
Owner NAT CANCER CENT