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ICT (In Circuit) test jig

A technology for testing fixtures and bottom boxes, which is applied to the casing of the measuring device, measuring leads/probes, etc. It can solve the problems of many connection ports, easy to shake the connecting line, and the connection of the terminal is not firm, so as to achieve easy connection and firm fixation. , The effect of not easy to fall off

Inactive Publication Date: 2012-06-13
KUSN MAIZHI FIXTURE TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For the ICT test fixture with the above structure, since there are many probes on the needle board, there are correspondingly many connecting wires. If all the connecting wires are directly connected to the terminals on the horn adapter board, there will be a lot of connecting ports. , and the connecting wire is easy to shake, it is easy to cause the connection of the terminal to be weak, once it is disconnected, it needs to be reconnected, and the horn adapter board is also easy to fall, which seriously affects the service life of the horn adapter board

Method used

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  • ICT (In Circuit) test jig
  • ICT (In Circuit) test jig
  • ICT (In Circuit) test jig

Examples

Experimental program
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Embodiment Construction

[0012] The present invention will be specifically introduced below in conjunction with the accompanying drawings and specific embodiments.

[0013] figure 1 It is a structural schematic diagram of an embodiment of the present invention; figure 2 It is a structural schematic diagram of the protective plate of the present invention.

[0014] Such as figure 1 and figure 2 Shown: the ICT test fixture, including the bottom box 1, the carrier plate and the pressing mechanism (not shown in the figure) arranged in sequence from bottom to top, and the upper surface of the upper cover of the bottom box 1 is a pin board, the needle plate is provided with a test probe, the lower part of the probe is a needle cover 2, the needle cover 2 is arranged on the lower surface of the upper cover of the bottom box, and is connected with the connecting line 3, and the The connection wire 3 communicates with the connection terminal on the horn adapter plate 4 arranged on the inner side of the b...

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PUM

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Abstract

The invention discloses an ICT (In Circuit) test jig, comprising a bottom box, a support plate and a pressing mechanism which are sequentially arranged from bottom to top. A needle plate is arranged on the upper surface of an upper cover plate of the bottom box and the needle plate is provided with a probe for testing; a needle sleeve is arranged at the lower part of the probe; the needle sleeve is arranged on the lower surface of the upper cover plate of the bottom box and is connected with a connecting wire; the connecting wire is communicated with a wiring terminal which is arranged on an oxhorn adapter plate at one side in the bottom box; a protection plate is further arranged on the lower surface of the oxhorn adapter plate and the protection plate is provided with a plurality of connecting points; and the two ends of the connecting points are respectively and fixedly connected with the connecting wire and the wiring terminal on the oxhorn adapter plate in a soldering manner. According to the invention, a plurality of fixing points are arranged between the oxhorn adapter plate and the protection plate; the oxhorn adapter plate is firmly fixed and is not easy to fall off; and the connecting wire is welded on the protection plate, so that the connecting wire is easy to connect even if a disconnected condition happens, and the oxhorn adapter plate is not damaged.

Description

technical field [0001] The invention relates to a test fixture, in particular to an ICT test fixture, which belongs to the technical field of circuit board test fixtures. Background technique [0002] The ICT test fixture usually includes a bottom box, a carrier plate and a pressing mechanism. The upper surface of the upper cover plate of the bottom box is a needle plate, and the needle plate is provided with test probes. The lower part of the probe is Needle sleeve, the needle sleeve is arranged on the lower surface of the upper cover plate of the bottom box, and is connected with the connection line, and the connection line is connected with the connection terminal arranged on the horn adapter plate on the inner side of the bottom box, and the The connecting terminal described above is connected to a test unit such as a computer. For the ICT test fixture with the above structure, since there are many probes on the needle board, there are correspondingly many connecting wi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/04G01R1/06
Inventor 盛如意
Owner KUSN MAIZHI FIXTURE TECH