Check patentability & draft patents in minutes with Patsnap Eureka AI!

Semiconductor chip with stair arrangement bump structures

A cascade structure, semiconductor technology, applied in the direction of semiconductor devices, semiconductor/solid-state device manufacturing, semiconductor/solid-state device components, etc., can solve problems such as thermal expansion coefficient mismatch, circuit board deformation, ductility difference, etc.

Inactive Publication Date: 2012-07-11
ATI TECH INC
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Flip chip solder joints may be subjected to mechanical stress from various sources such as thermal expansion coefficient mismatch, differences in ductility and board deformation
This stress subjects the conventional UBM structure just described to the bending moment

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Semiconductor chip with stair arrangement bump structures
  • Semiconductor chip with stair arrangement bump structures
  • Semiconductor chip with stair arrangement bump structures

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0020] Different embodiments of semiconductor chips are described herein. One example includes a solder bump connection structure fabricated as a stepped structure with two or more treads, such as a UBM structure. The stepped structure spreads the stress from the solder joint to a larger area to reduce the possibility of damage to the underlying passivation stack. More details will now be described.

[0021] In the figures that follow, reference numerals are generally repeated where the same element appears in more than one figure. Referring now to the accompanying drawings, especially the figure 1 , a diagram of an exemplary embodiment of a semiconductor chip device 10 including a semiconductor chip 15 mounted on a circuit board 20 is shown. An underfill material layer 25 is located between the semiconductor chip 15 and the circuit board 20 . The semiconductor chip 15 may be various types of circuit devices used in the electronics industry, such as a microprocessor, an im...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

Various semiconductor chip input / output structures and methods of making the same are disclosed. In one aspect, a method of manufacturing is provided that includes forming a first conductor structure on a first side of a semiconductor chip and forming a second conductor structure in electrical contact with the first conductor structure. The second conductor structure is adapted to be coupled to a solder structure and includes a stair arrangement that has at least two treads.

Description

technical field [0001] The present invention relates generally to semiconductor processing, and more particularly, to semiconductor chip solder bump pads and methods of forming solder bump pads. Background technique [0002] Flip-chip mounting schemes have been used for decades for mounting semiconductor chips onto circuit boards, such as semiconductor chip packaging substrates. In many conventional flip-chip variations, multiple solder joints are created between input / output (I / O) locations on the semiconductor chip and corresponding I / O locations on the circuit board. In one conventional process, solder bumps are metallurgically bonded to a given I / O site or pad of a semiconductor chip, and so-called pre-solder is metallurgically bonded to the corresponding I / O pads on the circuit board. / O position. Thereafter, the solder bump and pre-solder are brought into proximity and one or both of the solder bump and pre-solder are subjected to the heating process of reflow to cre...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/60H01L23/488H05K13/04
CPCH01L2924/01032H01L2224/05639H01L2924/0105H01L2224/81193H01L2924/00014H01L2224/05624H01L2224/05155H01L2924/35121H01L2224/1146H01L2224/16H01L2924/01022H01L2224/0401H01L2224/1147H01L2224/05558H01L2924/01013H01L2224/2919H01L24/81H01L2224/73204H01L2224/05166H01L23/49811H01L2924/01033H01L2924/01078H01L2224/05655H01L2224/03614H01L2924/01023H01L2924/01082H01L2224/16237H01L2224/03612H01L24/13H01L2224/05666H01L2924/01327H01L2924/01322H01L2924/01029H01L2224/05552H01L2924/014H01L2224/81191H01L2224/05644H01L2224/05018H01L2224/0345H01L24/03H01L2924/01047H01L2224/0346H01L2924/01079H01L2224/1132H01L24/05H01L2224/81815H01L2224/05647H01L23/49838H01L2924/01005H01L24/11H01L2924/01006H01L2924/3512H01L23/3192H01L24/29H01L2224/05599H01L2924/01014H01L24/16H01L2924/01075H01L2224/05147H01L2224/05024H01L2224/13111H01L2924/14H01L2924/01039H01L2924/00H01L2924/00012
Inventor 罗登·R·托帕西奥易普·森·罗
Owner ATI TECH INC
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More