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Hidden crack defect tester

A tester, defect technology, applied in the direction of optical testing flaws/defects, etc., can solve the problem of infrared imager inspection needing to adjust the position, etc., to achieve the effect of easy detection

Inactive Publication Date: 2012-09-19
SUZHOU SHENGCHENG NEW ENERGY TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The infrared imager of the existing hidden crack defect tester is fixed and the inside of the detector body cannot be adjusted according to the inspection needs

Method used

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Embodiment Construction

[0015] Below in conjunction with accompanying drawing, preferred specific embodiment of the present invention is described:

[0016] The hidden crack defect tester includes a cabinet-type detector body 1 with an inlet and an outlet, a feeding conveyor 2 arranged outside the inlet for transporting battery panels into the detector body 1, and a feed conveyor 2 arranged outside the outlet. The discharge conveyor 3 for conveying the battery board out of the detector body 1 .

[0017] The entrance and exit are set on the opposite sides of the detector body 1, and the detector body 1 also includes a conveyor belt arranged inside the detector body 1 and connected to the feeding conveyor 2 and the discharge conveyor 3. The middle conveyor 13 on the same horizontal plane, the reflector 14 installed under the conveyor belt of the middle conveyor 13, the infrared imager 15 arranged in the side wall of the detector body 1, and the reflector 14 is obliquely arranged on the detector b...

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Abstract

The invention discloses a hidden crack defect tester, which comprises a tester body, a middle conveyor which is arranged in the tester body and positioned on the same plane as the conveyer belts of a feeding conveyor and a discharging conveyor, a reflector which is arranged below the conveyor of the middle conveyor and an infrared imager which is arranged in the side wall of the tester body, wherein the infrared imager is arranged on a position adjusting mechanism fixed in the side wall of the tester body; the position adjusting mechanism comprises a horizontal guide rail which is perpendicular to the conveying direction of the conveyer belts and parallel to the horizontal plane, a vertical guide rail which is connected to the lower bottom surface of the horizontal guide rail along the length direction of the horizontal guide rail in a sliding mode and a mounting base which is connected to the lower bottom surface of the vertical guide rail along the length direction of the vertical guide rail in a sliding mode; and the infrared imager is fixedly arranged on the mounting base. The infrared imager is arranged on the position adjusting mechanism fixed in the side wall of the tester body, and the position adjusting mechanism can adjust the position of the infrared imager according to testing needs, so that the tester can conveniently test hidden crack defects.

Description

[0001] technical field [0002] The invention relates to a crack defect tester. [0003] Background technique [0004] The crack defect tester uses the electroluminescence principle of crystalline silicon, and uses a high-resolution CCD camera to take near-infrared images of components to obtain and determine the defects of components; it has the advantages of high sensitivity, fast detection speed, and intuitive results. Key equipment to improve the quality of photovoltaic modules; infrared detection can fully grasp the internal problems of solar cells, provide a basis for improving the production process, improve product quality, and repair problematic modules in time to reduce losses as much as possible. The infrared imager of the existing micro-crack defect tester is fixed and the inside of the detector body cannot be adjusted according to the inspection needs. [0005] Contents of the invention [0006] The object of the present invention is to provide a small crac...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88
Inventor 祖国良陈延林金春林毛吉亮曾祥林
Owner SUZHOU SHENGCHENG NEW ENERGY TECH
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