Parallel detection system and method

A detection system and detection method technology, applied in measurement devices, optical testing flaws/defects, instruments, etc., can solve problems such as non-reusability, high price, and inability to digitize measurement results, and achieve the effect of solving non-reusable

Active Publication Date: 2012-10-24
SHENZHEN CHINA STAR OPTOELECTRONICS TECH CO LTD
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Problems solved by technology

[0011] The purpose of the present invention is to overcome the existing problems of using pressure-sensitive paper to measure parallelism, which cannot be reused, is expensive, and cannot be converted into data.
[0012] The secondary purpose of the present invention is to overcome the existing problems of using pressure-sensitive paper to measure parallelism, which cannot be reused, is expensive, and cannot be converted into data.

Method used

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Embodiment Construction

[0029] Further details will be given below in conjunction with the embodiments shown in the accompanying drawings.

[0030] figure 2It is a structural diagram of the parallelism detection system 2 of the present invention. The parallelism detection system 2 includes a module to be tested 21 , a reference unit 22 and an optical measurement unit 23 . Wherein, the module under test 21 includes a unit under test 211 and an auxiliary unit 212 . The lower surface of the unit to be tested 211 is a flat surface to be tested 2111 , and the upper surface of the unit to be tested 211 is combined with the auxiliary unit 212 . The auxiliary unit 212 is used to adjust the inclination angle of the unit under test 211 and enable the unit under test 211 to move vertically up and down. The upper surface of the reference unit 22 is a flat reference surface 221 , so the reference surface 221 can be used as a reference plane for parallelism detection to compare the parallelism between the surf...

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Abstract

The invention discloses a parallel detection system and a parallel detection method. The system comprises a module to be detected with a unit to be detected, a reference unit and an optical measuring unit. The optical measuring unit comprises an optical measuring module and a displacement module. The lower surface of the unit to be detected is a surface to be detected. The upper surface of the reference unit is a reference surface. The optical measuring module comprises a light source unit, a reflection unit and a sensing unit. The light source unit emits a collimated light beam; the collimated light beam is reflected to the sensing unit sequentially through the surface to be detected, the reflection unit and the reference surface; the sensing unit senses the position of the collimated light beam to calculate a spacing distance between the surface to be detected and the reference surface, and the displacement module is used for moving the optical measuring module to measure the spacing distances between different points; and through a plurality of spacing distances, the parallelism between the surface to be detected and the reference surface can be detected.

Description

technical field [0001] The present invention relates to a parallelism detection system and its method, in particular to a parallelism detection system and its method using optical measurement technology. Background technique [0002] In the field of liquid crystal displays, the pursuit of thinness and high resolution of products is the future trend. Therefore, in the product production process, the accuracy and flatness of the alignment and combination of each component are more important. Therefore, the stability, precision and calibration actions of the production equipment will directly affect the production yield and quality of the product. The method currently used to detect the parallelism of production lamination equipment is generally to use pressure-sensitive paper for detection. [0003] Pressure-sensitive paper is a detection component used to accurately measure the pressure, pressure distribution and pressure uniformity. The pressure-sensitive paper will change ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/26G01B11/14G01B11/02
CPCG01N21/88G01B11/272
Inventor 陈方甫丁涛
Owner SHENZHEN CHINA STAR OPTOELECTRONICS TECH CO LTD
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