Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Test handling device and test handling method

A technology of a processing device and a processing method, which is applied in the field of test processing devices and test processing, can solve problems such as limited scope of application, inability to support tests, and low test coverage, so as to avoid differences in test results, improve development quality, and improve The effect of testing efficiency

Active Publication Date: 2016-01-20
YONYOU NETWORK TECH CO LTD
View PDF2 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, because different class loaders are used to load program codes in the OSGi environment to achieve loose coupling and dynamic deployment of components, this mechanism is completely different from traditional applications, so that the testing methods used in traditional application development cannot Easy porting to OSGi environments
This contradiction makes the current OSGi-based software system development have some common problems of varying degrees: a. Automated testing cannot be performed but manual testing with low efficiency can only be used. Regression testing after software system changes is time-consuming and laborious. The coverage rate is low; b. The test case code is closely dependent on the target component of the test and cannot be deployed separately; c. The test case can only be tested for some components that do not depend on the running of the system context, resulting in components that depend on the business context Unable to create automated test cases
Therefore, the scope of application of this method is relatively limited. Usually, most of the functional components of a software system need to depend on the context of the system in terms of transaction, security, data access, log and other functions, so the above test framework cannot support the testing of such components. test

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Test handling device and test handling method
  • Test handling device and test handling method
  • Test handling device and test handling method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0036] In order to understand the above-mentioned purpose, features and advantages of the present invention more clearly, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0037]In the following description, many specific details are set forth in order to fully understand the present invention, but the present invention can also be implemented in other ways different from those described here, therefore, the present invention is not limited to the specific embodiments disclosed below limit.

[0038] figure 2 A flow chart of a test processing method according to an embodiment of the present invention is shown.

[0039] Such as figure 2 As shown, the present invention also provides a test processing method, comprising: step 202, obtaining the test case in the system; step 204, setting the context parameters required by the test target component to the thread context of the test case; step...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a test processing device, comprising a test case acquisition module, a context parameter setting module and a test case execution module, wherein the test case acquisition module is used for acquiring a test case in a system; the context parameter setting module is used for setting context parameters required by a test objective component in a thread context of the test case; and the test case execution module is used for executing the test case to test the objective component. Accordingly, the invention also provides a test processing method. By the technical solution of the invention, aiming at a software system based on open service gateway initiative (OSGI), a context consistent with an actual environment is provided for execution of the test case, thus different testing results caused by various execution environments is avoided, and loose coupling between the test case and a test object is achieved. In addition, test cases can be executed in batch, thereby the testing efficiency of the software system is improved and the development quality of the software system is promoted as well.

Description

technical field [0001] The invention relates to the field of software testing, in particular to a test processing device and a test processing method. Background technique [0002] OSGi (OpenService Gateway Initiative) is a dynamic model system for Java, which defines an infrastructure for the development of modular applications, so that applications can implement well-defined, reusable and collaborative standard components, and can be flexibly and dynamically Assembled and deployed into the application system. Due to these characteristics, OSGi has been widely used in the industry and has become one of the preferred architectures for software integration and enterprise development. [0003] However, because different class loaders are used to load program codes in the OSGi environment to achieve loose coupling and dynamic deployment of components, this mechanism is completely different from traditional applications, so that the testing methods used in traditional applicati...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36
Inventor 黄海泉
Owner YONYOU NETWORK TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products