Camera source evidence obtaining method based on mode noise big component

A pattern noise, large component technology, applied in image analysis, image data processing, instrumentation, etc., can solve the problem that the detection efficiency needs to be improved, and achieve the effect of enhancing the high frequency pattern noise component and strong robustness

Active Publication Date: 2012-12-12
JIANGNAN UNIV
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  • Claims
  • Application Information

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Problems solved by technology

This method can effectively reduce the computational complexity of the algorithm, but the detection efficiency still needs to be improved.

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  • Camera source evidence obtaining method based on mode noise big component
  • Camera source evidence obtaining method based on mode noise big component
  • Camera source evidence obtaining method based on mode noise big component

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Embodiment Construction

[0043] The specific embodiments of the present invention will be further described below in conjunction with the accompanying drawings.

[0044] Summary of the principles of the invention:

[0045]According to the principle of photoresponse nonuniformity, when each pixel of the imaging sensor is illuminated by a uniform light source, it has photoresponse nonuniformity (PRNU). Since this non-uniformity has no certain rules, it varies from device to device and has great randomness, so the imaging sensors in different cameras have different photoresponse non-uniformity, and this difference and randomness are precisely due to each Due to the different distribution of light response sensitive pixels and insensitive point pixels in an imaging sensor, the characteristics and effects of these two types of points in PRNU are different. Through the analysis of the non-uniform characteristics of light response, the light response is sensitive The value at the point will fluctuate random...

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Abstract

The invention discloses a camera source evidence obtaining method based on a mode noise big component, which is divided into two parts of mode noise big component extraction and relevancy detection. The camera source evidence obtaining method based on the mode noise big component specifically comprises the following steps of: selecting a picture; sharpening an image; carrying out filtering processing; extracting a big component; calculating a relevant coefficient; and distinguishing a source. According to the camera source evidence obtaining method based on the mode noise big component, the image is preprocessed by a Laplace operator, a high-frequency mode noise ingredient is effectively enhanced, and the influence of other low-frequency factors, such as scene noise and the like is eliminated. While the detection accuracy is guaranteed, the computation complexity of an algorithm is lowered to a large extent. Detection is carried out by a photoresponse sensitive spot set in mode noise, and a new concept of image source identification based on mode identification is opened up. The camera source evidence obtaining method based on the mode noise big component has the advantages of simpleness, convenience and strong robustness in practical application.

Description

technical field [0001] The invention belongs to the field of digital image passive forensics, in particular to a camera source forensics method based on a large component of pattern noise. Background technique [0002] Pattern noise inherent in imaging sensors is caused by factors such as material imperfections and process imperfections. It consists of two important parts: fixed pattern noise (Fixed Pattern Noise, FPN) caused by dark current and photon response non-uniformity noise (Photo-Response Non-uniformity, PRNU) of photosensitive materials. Among them, FPN is a kind of additive noise, which exists whether the shutter is open or closed, but in mid-to-high-end cameras, FPN can be eliminated by subtracting a dark frame, and FPN will also weaken as the temperature decreases. , so FPN is not suitable as the internal watermark of the camera. The PRNU pattern noise is mainly generated by the non-uniformity and imperfection of the semiconductor wafer, which is mainly reflec...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T5/00G06T7/00
Inventor 周翠娟
Owner JIANGNAN UNIV
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