Method and device for selecting test point of artificial electromagnetic material unit
An artificial electromagnetic material and test point technology, applied in the field of metamaterials, can solve the problem of consuming large resources, and achieve the effect of saving test resources, reducing the number of selections, and optimizing the test design.
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[0022] Embodiments of the present invention provide a method and device for selecting test points of an artificial electromagnetic material unit. Each will be described in detail below.
[0023] The flow chart of the test point selection method of a kind of artificial electromagnetic material unit in embodiment 1 of the present invention can refer to figure 1 , the method includes:
[0024] Step 101, acquiring the geometric parameters of the artificial electromagnetic material unit to be tested and the number of sample points for sampling the geometric parameters.
[0025] The geometric parameters may be a set of parameter descriptions representing the geometric shape and size of the artificial electromagnetic material, and each parameter corresponds to multiple value levels. For example: the artificial electromagnetic material unit of a kind of " I " topological structure, its geometric parameter is defined as a vector G=[a, b, w], and the value ranges of a, b and w three a...
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