OIN (Optimal Input Normalization) neural network training method for mixed SVM (Support Vector Machine) regression algorithm

A neural network training and regression algorithm technology, applied in the field of data analysis, can solve the problems that Boolean values ​​are difficult to apply to neural network backward propagation, and there is no specific point of ANN-SVM training weight correction and failure to reach, etc.

Active Publication Date: 2013-03-20
SHANDONG UNIV
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Problems solved by technology

However, the output described according to the mechanism is a Boolean category value directly obtained by the SVM classification algorithm, and the Boolean value is difficult to apply to the backpropagation process of the neural network; therefore, the mechanism does not specifically point out ANN-SVM How to train and how to implement weight correction
[0008] The present invention is suitable for solving related problems in data analysis. For example, the problem of color constancy in image segmentation, that is, the problem of image segmentation under the influence of different illuminations. The existing image segmentation does not use learning algorithms, but only uses the conversion of color space , under the influence of complex lighting, it cannot meet the ideal requirements

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  • OIN (Optimal Input Normalization) neural network training method for mixed SVM (Support Vector Machine) regression algorithm
  • OIN (Optimal Input Normalization) neural network training method for mixed SVM (Support Vector Machine) regression algorithm
  • OIN (Optimal Input Normalization) neural network training method for mixed SVM (Support Vector Machine) regression algorithm

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[0083] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0084] The system structure of the present invention is mainly divided into two parts: OIN and SVM two parts, such as figure 1 shown. Among them, the OIN part only contains one hidden layer. exist figure 1 , given N v training sample set {(x p ,t p )},x p =[x p (1), x p (2),...x p (N+1)] T Represents the augmented input vector of the p-th sample, where N is the dimension of the input vector, X p (N+1) is an augmentation term of the input vector set for the convenience of calculating the hidden layer threshold, x p (N+1)=1. t p =[t p (1),t p (2),...t p (M)] T Represents the input vector of the pth sample, M represents the dimension; the number of neural units in the hidden layer is N h , then W ih ={w ih (i,k)} represents all the connection weights from the input layer to the hidden layer, with N*N h Dimensions, O p (1),Op (2),...,O...

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Abstract

The invention discloses an OIN (Optimal Input Normalization) neural network training method for a mixed SVM (Support Vector Machine) regression algorithm. The method mainly comprises the steps of an OIN forward propagation part, a SVM regression part and an OIN backward propagation part; and finally, an optimized OIN / SVM mixed model is obtained through various trainings; and in a testing stage, a testing sample is input into the optimized OIN / SVM mixed model to obtain a predicated result, so that the classification of the sample or the regression of the sample is predicated. According to the invention, a latest designed OIN artificial neural network training method is adopted; and through the adoption of the method disclosed by the invention, the convergence of the traditional backward propagation algorithm can be greatly improved.

Description

technical field [0001] The invention relates to a data analysis method, in particular to an OIN neural network training method of a mixed SVM regression algorithm. Background technique [0002] Artificial Neural Network (ANN, Artificial Neural Network) is an optimized machine learning method and is widely used in various data analysis fields to replace or supplement polynomial-based regression analysis and classification. Existing neural network applications can only be limited to simple designs with a small number of design parameters, and the required data set size for modeling should increase geometrically or exponentially with the number of design parameters. Therefore, a neuron analysis requires There are a large number of sufficient density distributions and experimental data, on the other hand, the computational cost increases accordingly, and the inefficient use of a large amount of data in the design space may also lead to excessive waste of computational cost. [...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06N3/02
Inventor 蔡珣蔡菲吕知辛朱波马军
Owner SHANDONG UNIV
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