Electronic device comprehensive environment accelerated storage testing device

An accelerated storage test and comprehensive test technology, applied in the field of electronic equipment and its life evaluation, can solve the problems of low failure rate, long storage time, and difficult research technology

Inactive Publication Date: 2013-10-09
BEIHANG UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] For the electronic equipment on the product, its storage time is long and the failu

Method used

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  • Electronic device comprehensive environment accelerated storage testing device
  • Electronic device comprehensive environment accelerated storage testing device
  • Electronic device comprehensive environment accelerated storage testing device

Examples

Experimental program
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Effect test

Embodiment Construction

[0053] The outer box of the temperature and humidity comprehensive test box adopts SUS304 high-grade stainless steel plate or steel plate electrostatic spraying surface treatment, which increases the appearance texture and cleanliness and has good corrosion resistance. Size: 130×160×180cm; the inner box adopts SUS304 High and low temperature resistant stainless steel plate, size: 100×100×100cm; the thermal insulation layer formed between the inner box and the outer box of the temperature and humidity comprehensive test box adopts high-density glass fiber wool or asbestos board to avoid Necessary energy loss.

[0054] The door of the test chamber is designed as a single door, which uses a non-reactive door handle and opens from right to left. Double-layer heat-resistant tensile sealing strips are used between the box door and the box body to ensure the airtightness of the test area. An observation window is designed on the box door. The size of the observation window is 25×30c...

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Abstract

The invention relates to an electronic device comprehensive environment accelerated storage testing device which comprises a temperature and humidity comprehensive testing box, a control microcomputer and a temperature and humidity tester. An outer box body of a box shell of the temperature and humidity comprehensive testing box is made of corrosion resistant plates, an inner box body of the box shell of the temperature and humidity comprehensive testing box is made of high-and-low temperature resisting corrosion resistant plates, and an insulating layer formed by the inner box body and the outer box body is made of high-density glass fiber cotton or asbestos plates. The control microcomputer and the temperature and humidity tester are both in conventional types. The electronic device comprehensive environment accelerated storage testing device has stable and balanced heating and humidifying capability, can carry out high-accuracy high-stability constant-temperature constant-humidity control and guarantees the safety of equipment and people. As for a temperature and humidity control part of the equipment, the programmable temperature and humidity tester is adopted to be capable of simulating different environmental conditions such as the high-temperature high-humidity environment, the high-temperature low-humidity environment, the low-temperature high-humidity environment, the high-temperature environment and the low-temperature environment. An accelerated storage service life evaluation method based on a reliability growth model avoids selection of an accelerated model, and the electronic device comprehensive environment accelerated storage testing device is mainly used in step-down stress accelerated service life tests and has good adaptability to electronic devices with complicated composition and failure mechanisms.

Description

technical field [0001] The invention provides an electronic equipment comprehensive environmental accelerated storage test device and a method for evaluating its life, and belongs to the technical field of electronic equipment and its life evaluation. Background technique [0002] The reliability growth test improves the reliability of the product by stimulating failure in a planned way, analyzing the cause of failure and improving the design, and proving the effectiveness of the improvement measures. Through the reliability growth test, the weak link with low environmental stress resistance is eliminated to improve the environmental stress resistance of the entire product. [0003] For the step stress accelerated life test, although no improvement measures are taken for the product in the test, the stress is increased. Obviously, the reliability of the product will not increase but decrease; therefore, if the improvement measures taken for the product are taken to increase...

Claims

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Application Information

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IPC IPC(8): G01R31/00G01R1/04
Inventor 姚军苏泉徐明鸽
Owner BEIHANG UNIV
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