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Method and device for measuring signal

A measurement and signal technology, applied in the field of measurement signals, to achieve the effect of suppressing the interference of high-order harmonics and simplifying the operation

Active Publication Date: 2016-08-24
EGALAX EMPIA TECH INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] The purpose of the present invention is to overcome the defects of the existing technology and provide a method and device for measuring signals with a new structure. The technical problem to be solved is that when the signal orthogonal mode is used as the basis of signal processing, There will be many odd harmonics in the square wave drive. When there is a narrow frequency interference near the odd harmonics, the influence of the interference cannot be eliminated.

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  • Method and device for measuring signal
  • Method and device for measuring signal
  • Method and device for measuring signal

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Embodiment Construction

[0063] In order to further explain the technical means and effects adopted by the present invention to achieve the intended purpose of the invention, the specific implementation, structure and characteristics of the method and device for measuring signals proposed by the present invention will be described below in conjunction with the accompanying drawings and preferred embodiments. And its effect, detailed description is as follows.

[0064] see Figure 1A , is a position detecting device 100 applied in the present invention, including a touch screen 120 and a driving / detecting unit 130 . The touch screen 120 has a sensing layer. In the example of the present invention, a first sensing layer 120A and a second sensing layer 120B may be included, and the first sensing layer 120A and the second sensing layer 120B respectively have a plurality of conductive strips 140, wherein the first sensing layer 120A A plurality of first conductive strips 140A overlap with a plurality of s...

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Abstract

The invention relates to a method and a device for measuring a signal. A coefficient table is established according to a plurality of predetermined phase positions, wherein each predetermined phase position is assigned with a coefficient. Chord waves are measured in the plurality of predetermined phase positions in every half cycle to generate measurement signals respectively, and weighting measurement signals are generated respectively on the basis of each measurement signal multiplied by the coefficient corresponding to the phase position in measurement. Afterwards, the weighting measurement signals are totaled up to generate a complete measurement signal representing a single-time measurement result.

Description

technical field [0001] The present invention relates to a method and device for measuring signals, in particular to a method and device for measuring signals using a signal orthogonal mode as the basis for signal processing. Background technique [0002] The existing known mutual capacitive sensor (mutual capacitive sensor) includes an insulating surface layer, a first conductive layer, a dielectric layer, and a second conductive layer, wherein the first conductive layer and the second conductive layer have a plurality of first conductive layers respectively. strips and second conductive strips, these conductive strips may be composed of a plurality of conductive strips and connection lines of series conductive strips. [0003] When performing mutual capacitance detection, one of the first conductive layer and the second conductive layer is driven, and the other of the first conductive layer and the second conductive layer is detected. For example, the driving signal is pro...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F3/044
CPCG06F3/0416G06F3/0418G06F3/044
Inventor 张钦富
Owner EGALAX EMPIA TECH INC