Ultralow-temperature impact test device and test method thereof

A technology of impact testing and low-temperature equipment, which is applied in the field of ultra-low temperature testing, can solve problems such as changes in material properties of samples, inconsistencies in actual conditions, and troubles for experimental testers, and achieve the effect of reducing the possibility of phase transition and timely observation

Active Publication Date: 2015-05-20
HEFEI GENERAL MACHINERY RES INST
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

The above temperature compensation method does meet the experimental requirements of some samples under low temperature experiments, but its defects still cannot be underestimated: the temperature compensation method has requirements for the low temperature limit that the sample itself can finally withstand, especially for its own For metal materials with low-temperature phase transitions, excessively large subcooling temperature compensation values ​​are likely to cause metal phase transitions, which will lead to changes in the material properties of the samples, which will make the test results inconsistent with the actual situation, and eventually lead to the The measured experimental data has no practical use value at all; in addition, when conducting some ultra-low temperature shock tests, its refrigeration system can barely meet the experimental temperature requirements. Once the value of its subcooling temperature compensation value is too large, it will After adding the subcooling temperature compensation value on the basis, the refrigeration system may not be able to reach the minimum temperature of the experiment, which will bring great trouble to the experiment testers

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  • Ultralow-temperature impact test device and test method thereof
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  • Ultralow-temperature impact test device and test method thereof

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Embodiment Construction

[0038] For ease of understanding, here in conjunction with accompanying drawing, specific testing device of the present invention and its operation process are further described as follows:

[0039] In fact, the purpose of the present invention is to realize the controllable temperature of the test down to -263°C, overcome the inaccurate test temperature and the difficulty of heat preservation, and provide an ultra-low temperature impact performance test system and corresponding test method. Considering the lowest value of the controllable temperature in the current test, it is obvious that the closer it is to the lowest value, the more difficult it is to obtain the temperature, especially for ultra-low temperature test samples close to the lowest temperature value, once the compensation value of the supercooling temperature is too large , resulting in the predetermined minimum temperature of the experiment being lower than the minimum value of the controllable temperature of t...

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Abstract

The invention relates to the field of ultralow-temperature tests and in particular relates to an ultralow-temperature impact test device and a test method thereof. The device at least comprises a sample used as a test object, a temperature reduction assembly and an impact test assembly used for performing a sample impacting operation, wherein the surface of the sample is coated with an insulation layer. The device is simple in structure and convenient to realize, and can be used for remarkably reducing the supercooling temperature compensation value of a sample material to effectively guarantee the accuracy demand of a final impact test result. Meanwhile, the invention further provides the test method based on the ultralow-temperature impact test device, and the test method comprises the following steps: coating the surface of the sample with the insulation layer; performing temperature reducing and keeping operations on a preset temperature; performing a temperature return test on the sample; determining a lowest test temperature required to be set by a low-temperature device of a freezing machine; comparing impact tests; performing a conventional ultralow-temperature impact test; effectively and stably guaranteeing the operation demand of the device to further guarantee the accuracy of the test result.

Description

technical field [0001] The invention relates to the field of ultra-low temperature testing, in particular to an ultra-low temperature impact testing device and a testing method thereof. Background technique [0002] With the development of science and technology, cryogenic and low-temperature environmental conditions frequently appear in many fields such as low-temperature superconductivity, aerospace, and petrochemical industries. The requirements for the low-temperature performance of materials are becoming increasingly stringent. Research on the mechanical properties of corresponding materials at low or even ultra-low temperatures It has been highly valued by scholars at home and abroad, and most of its research scope is concentrated in the general cold low temperature environment (not lower than -153 ° C), while the research on the mechanical properties of materials at ultra-low temperatures is often less; this is mainly because of ultra-low temperature experiments. The ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N3/30G01N3/02
Inventor 陈勇陈学东陆戴丁吕运容范志超
Owner HEFEI GENERAL MACHINERY RES INST
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