Method for processing bad block in memory of mobile terminal and mobile terminal
A technology of a mobile terminal and a processing method, which is applied in the field of memory bad block processing, and can solve problems such as function opening failure, difficulty in distinguishing, file storage opening failure, etc., and achieve the effect of avoiding opening failure
Active Publication Date: 2016-08-17
威海神舟信息技术研究院有限公司
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Problems solved by technology
In the daily use of mobile terminals, people often encounter some functions that fail to open, which is often caused by bad blocks in the memory.
However, in the prior art, it is not easy to distinguish whether there is a bad block on the power-off non-volatile memory or a bad block on the power-off volatile memory, which cannot be shielded in time, and it is often easy to fail to open the file storage, causing trouble to the user
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[0033] In order to make the object, technical solution and advantages of the present invention more clear and definite, the present invention will be further described in detail below with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.
[0034] See figure 1 , figure 1 It is a flow chart of a preferred embodiment of the method for processing bad blocks in the memory of the mobile terminal of the present invention. Such as figure 1 As shown, the memory bad block processing method of the mobile terminal includes:
[0035] Step S100, when a certain application program is opened, obtain the address and size of the application in the power-fail non-volatile memory, and copy the application program to the power-failure volatile memory to run, and record the application program in the power-failure volatile memory. The addre...
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The invention discloses a memory bad block processing method of a mobile terminal and the mobile terminal. The method includes: when a certain application program is opened, obtain the address and size of the application in the power-fail non-volatile memory, and copy the The application program runs in the power-failure volatile memory, and records the address and size of the application program in the power-failure volatile memory; when the application program fails to open, it means that there is an Then copy the application program to another address in the power-off volatile memory to run. If the application is successfully opened, it means that there are bad blocks in the power-failure volatile memory. If the application fails to open, it means that the power-off is not easy to lose. There are bad blocks in the memory. With the present invention, it is easy to distinguish whether the bad block is in the power-off non-volatile memory or the power-off volatile memory, the bad block can be shielded in time, and the failure to open the file storage is not easy to occur, which provides convenience for users.
Description
technical field [0001] The invention relates to the field of mobile terminals, in particular to a method for processing bad blocks in memory of a mobile terminal and the mobile terminal. Background technique [0002] The memory of the mobile terminal includes power-fail non-volatile memory and power-fail volatile memory. As the name implies, power-fail non-volatile memory can still save data after power failure, while power-fail volatile memory will lose data after power failure. In mobile terminals, power-off non-volatile memory mainly includes FLASH (flash memory), EEPROM (Electrically Erasable Programmable Read-Only Memory), etc. Power-off volatile memory mainly includes DRAM (Dynamic Random Access Memory), SDRAM (Synchronous Dynamic RAM), etc. [0003] As the functions of the mobile terminal become more and more powerful, the mobile terminal has become an indispensable part of people's daily life, and the memory, as one of the most important components of the mobile ter...
Claims
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IPC IPC(8): G06F12/02
Inventor 杨维琴
Owner 威海神舟信息技术研究院有限公司