Mobile terminal and memory bad-block processing method thereof

Abstract

The invention discloses a mobile terminal and a memory bad-block processing method thereof. The memory bad-block processing method includes that when a certain application program is opened, an address and a size of the application program in a power-failure nonvolatile memory are required, the application program is copied to a power-failure volatile memory for running, and an address and a size of the application program in the power-failure volatile memory are recorded; when the application program fails to open, it shows that bad blocks exist in the power-failure nonvolatile memory or the power-failure volatile memory; the application program is copied to another address of the power-failure volatile memory for running, if the application program is opened successfully, it shows that the bad blocks exist in the power-failure volatile memory, and if the application program fails to open, it shows that the bad blocks exist in the power-failure nonvolatile memory. By the method, the bad blocks can be easily figured out whether exist in the power-failure nonvolatile memory or the power-failure volatile memory and shielded in time, failure in opening and storing of files is less prone to occurrence, and convenience is brought to users.

Description

technical field [0001] The invention relates to the field of mobile terminals, in particular to a method for processing bad blocks in memory of a mobile terminal and the mobile terminal. Background technique [0002] The memory of the mobile terminal includes power-fail non-volatile memory and power-fail volatile memory. As the name implies, power-fail non-volatile memory can still save data after power failure, while power-fail volatile memory will lose data after power failure. In mobile terminals, power-off non-volatile memory mainly includes FLASH (flash memory), EEPROM (Electrically Erasable Programmable Read-Only Memory), etc. Power-off volatile memory mainly includes DRAM (Dynamic Random Access Memory), SDRAM (Synchronous Dynamic RAM), etc. [0003] As the functions of the mobile terminal become more and more powerful, the mobile terminal has become an indispensable part of people's daily life, and the memory, as one of the most important components of the mobile ter...

AI Technical Summary

Problems solved by technology

In the daily use of mobile terminals, people often encounter some functions that fail to open, which is often caused by bad blocks in the memory.

However, in the prior art, it is not easy to distinguish whether there is a bad block on the power-off non-volatile memory or a bad block on the power-off volatile memory, which cannot be shielded in time, and it is often easy to fail to open the file storage, causing trouble to the user

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