A Calculation Method of Electronic Product Mission Reliability Based on Fault Physics

A technology of fault physics and calculation methods, which is applied in computing, sustainable transportation, electrical digital data processing, etc., and can solve problems such as the reliability of computing product tasks

Active Publication Date: 2016-06-15
BEIHANG UNIV
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Problems solved by technology

Through the novelty search and retrieval of existing technologies, there are no reports at home and abroad on the calculation of product task reliability based on the fault physical model and combining all tasks in the product life cycle

Method used

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  • A Calculation Method of Electronic Product Mission Reliability Based on Fault Physics
  • A Calculation Method of Electronic Product Mission Reliability Based on Fault Physics
  • A Calculation Method of Electronic Product Mission Reliability Based on Fault Physics

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Embodiment Construction

[0061] The present invention will be further described in detail below with reference to the drawings and embodiments.

[0062] The following examples are based on figure 1 The implementation of the process shown mainly includes determining the temperature and vibration environment profile of each task of the electronic controller, using Flotherm to simulate the software temperature stress, using ANSYS software to simulate the vibration stress distribution, stress damage analysis, damage accumulation analysis, and selecting fault physics The model uses Monte Carlo simulation to determine the main failure mechanism and pre-failure time of the electronic controller in each task, counts the main failure mechanism of the electronic controller, and calculates the mean time before failure. The electronic controller hardware is composed as figure 2 As shown, it includes a chassis, a power supply module, a central processing unit, a power conversion module, a signal processing module, a...

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Abstract

A PoF based method for calculating mission reliability of an electronic product comprises steps as follows: step one, information of all mission profiles of the product is collected, and an environment profile of each mission is determined; step two, thermal simulation and vibration simulation of environmental stress of each mission are performed, and a local response of the product to an environmental load is obtained; step three, a product simulation model is established; step four, simulation calculation of the product in all the mission profiles is completed, and the mean time to failure and a main failure mechanism of the product are obtained; and step five, the mission reliability of the product is calculated according to the mean time to failure. According to the PoF based method for calculating the mission reliability of the electronic product, all missions of the product during lifetime use are considered, the environmental stress of each mission is simulated, and the mean time to failure and the mission reliability of the product are comprehensively calculated. By means of a PoF model, the direction relation between parameters of a product material, structure, process and the like and the reliability can be obtained, and a design improvement direction is clearly and directly provided for the product.

Description

Technical field [0001] The invention provides a method for calculating the reliability of an electronic task based on fault physics, in particular to a method for calculating the reliability of a multitask electronic product task based on the physics of a fault, and belongs to the field of product reliability prediction. Background technique [0002] With the rapid development of technology, the complexity of electronic products continues to increase. For electronic products with high reliability requirements, the ability to analyze and quantitatively calculate their reliability in the design stage is of great significance for discovering weak links in product design and making design changes. Traditionally, in the early stages of design, engineers mainly use experience-based methods to predict the reliability of electronic products. This method relies on the subjective judgment of engineers, which often leads to inaccurate over-design problems or ignoring certain weak parts. An...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F17/50
CPCY02T90/00
Inventor 骆明珠陈颖叶翠康锐
Owner BEIHANG UNIV
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