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Embedded system power failure test system and method

An embedded system, electrical testing technology, applied in the detection of faulty computer hardware, etc., can solve the problems of limited coverage of power-down points, low efficiency, labor and time consumption, etc., to reduce workload, improve work efficiency, Automate the effect

Active Publication Date: 2017-01-11
FUJIAN LANDI COMML EQUIP CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Existing test methods generally use manual power-on and power-off, which consumes manpower and time, has low efficiency, and the coverage of power-down points is very limited.

Method used

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  • Embedded system power failure test system and method
  • Embedded system power failure test system and method
  • Embedded system power failure test system and method

Examples

Experimental program
Comparison scheme
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Embodiment Construction

[0042] In order to describe the technical content, structural features, achieved goals and effects of the present invention in detail, the following will be described in detail in conjunction with the embodiments and accompanying drawings.

[0043] see figure 1 , figure 1 It is a structural block diagram of the power-down test system of the embedded system, the power-down test system of the embedded system includes an embedded system terminal 100 and a power supply module 200, and the embedded system terminal 100 includes a test module 110, an execution module 120, a calibration module Test module 130.

[0044] The test module 110 is used to control the embedded system terminal 100 to send a power down command to the power module 200 according to the power down event.

[0045] The execution module 120 is used to control the embedded system terminal 100 to execute test cases.

[0046] The power module 200 is used for powering down and powering up the embedded system terminal...

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Abstract

The invention discloses a method for testing the power failure of an embedded system. The method comprises the steps that an embedded system terminal sends a power failure instruction to a power module according to power failure events; the embedded system terminal carries out a test case; the power module carries out power failure and electrification on the embedded system terminal according to the power failure instruction; the embedded system terminal carries out a checkout function. The invention further discloses a system for testing the power failure of the embedded system. Compared with a testing method with manual electrification and power failure in the prior art, the method has the advantages that the automation of power failure testing is achieved through operation of a testing module, the working efficiency is improved remarkably, the workloads of testing personnel are relieved, power failure points cover the whole process when the embedded system terminal carries out the test case in the process of carrying out the power failure events, and the power failure can be tested in the whole process.

Description

technical field [0001] The invention relates to an embedded system, in particular to a power-down testing system and method for the embedded system. Background technique [0002] In the application process of embedded systems, accidents such as sudden power failure will inevitably occur, which puts forward relatively high requirements for product reliability, which requires us to simulate power-down conditions and environments to test and verify products Whether it can maintain high reliability in the event of unexpected power loss. Existing test methods generally use manual power-on and power-off, which consumes manpower and time, has low efficiency, and has very limited coverage of power-down points. Contents of the invention [0003] The technical problem mainly solved by the present invention is to provide a power-down testing system and method of an embedded system capable of realizing power-down test automation. [0004] In order to solve the problems of the techno...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/22
Inventor 林晋安林亮
Owner FUJIAN LANDI COMML EQUIP CO LTD