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Low temperature step test method for anti-skid brake control box
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An anti-skid braking and control box technology, applied in electrical testing/monitoring, etc., can solve problems such as hidden troubles and limited cooling capacity of compressors, and achieve the effect of reducing energy consumption and saving test time.
Inactive Publication Date: 2016-04-06
XIAN AVIATION BRAKE TECH
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Problems solved by technology
However, in the low-temperature fault test, due to the limited cooling capacity of the compressor, liquid nitrogen must be used to assist temperature control in order to stimulate potential faults
Method used
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Embodiment 1
[0075] This embodiment is to carry out the low-temperature step test on the anti-skid brake control box of the brake system of the first domestic regional aircraft, and the test equipment adopted is CH12000CVT30ESS comprehensive environmental stress test chamber.
[0076] The concrete steps of this embodiment are:
[0077] Step 1, determine the test parameters
[0078] The test parameters include the starting point of the test temperature, the cooling step and cooling rate, the holding time at each step, the anti-skid brake operating current and its application method, the required value of the low temperature damage limit, and the number of test samples.
[0079] Determine the starting point of the test temperature. The starting point of the test temperature in this embodiment is -25°C.
[0080] Determine the cooling step size. In order to accurately determine the low-temperature damage limit value of the anti-skid brake control box, provide low-temperature damage data for...
Embodiment 2
[0118] The processes of embodiment 2 and embodiment 3 all include determining test parameters, testing the low-temperature holding time of the anti-skid brake control box in the comprehensive environmental test chamber, formulating the low-temperature step test profile, testing the low-temperature damage limit and controlling the anti-skid brake after the improvement Carry out each step of test verification, its specific process is the same as that of Example 1, the difference is that the test data in Example 2 and Example 3 are different from that of Example 1, as shown in Table 2 for details.
[0119] Table 2 Summary of main test data of low temperature failure of anti-skid brake control box tested by liquid nitrogen assisted cooling
[0120]
[0121] In each of the above-mentioned embodiments, low-temperature step-by-step tests are carried out on the anti-skid brake control boxes of three kinds of transporter braking systems, and the low-temperature damage limit of the an...
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Abstract
The invention provides a method of an anti-skidding brake control box low-temperature stepping test. The test is conducted through three kinds of comprehensive test equipment, and liquid nitrogen is adopted to assist in cooling in the airplane anti-skidding brake control box low-temperature stepping test. The method comprises the steps that an anti-skidding brake work current is exerted under the lower-temperature stepping condition, whether performance of an anti-skidding brake control box is qualified is tested, and if the performance of the anti-skidding brake control box is not qualified, improvement recommendations are provided and lower-temperature resistant performance of the anti-skidding brake control box is enhanced; if the performance of the anti-skidding brake control box is qualified, the test continues to be conducted until requested lower-temperature resistant ability is achieved. The low-temperature stepping test is one of high acceleration life tests, and test data of a low-temperature breaking limit serve as one of bases for making a high acceleration stress screening test section. By means of the method, low-temperature fault hidden danger of the anti-skidding brake control box can be can effectively stimulated, the improvement recommendations for the fault hidden danger are provided and implemented, the data of the low-temperature breaking limit of the improved anti-skidding brake control box serve as data for making the high acceleration stress screening test section, and the low-temperature breaking limit required by the high acceleration stress screening test section is determined.
Description
technical field [0001] The invention relates to the field of electronic products of a transportation aircraft braking system, in particular to a method for testing low-temperature faults of an anti-skid brake control box. Background technique [0002] The low-temperature step test technology for electronic products comes from the low-temperature damage limit test method in the GMW8287 "Highly Accelerated Life, Highly Accelerated Stress Screening and Sampling Inspection" standard. The present invention is a cyclical process of applying low-temperature step-by-step stress and carrying out technical improvement aiming at low-temperature faults, and the improvement is carried out until the unconditional improvement or when the target value has been reached. [0003] The anti-skid brake control box is an electronic product in the aircraft anti-skid brake system. It is designed with the function of braking on the take-off line, the anti-skid function during landing braking, the gr...
Claims
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