Method for refining static defect detection on basis of state partitions
A defect detection and attribute state partitioning technology, applied in the field of detection refinement, can solve the problems of false positives, no distinction, loss of path information, etc., and achieve the effect of improving analysis accuracy, reducing accuracy loss, and avoiding accuracy loss.
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[0024] Embodiments of the present invention will be described in detail below with reference to the accompanying drawings.
[0025] First, a defect pattern is a description of a program property that, if violated, causes a defect. For example, the requested resources must be released after use, otherwise resource leakage defects will be caused, and the defect mode can be represented by a defect state machine, where the state machine is a commonly used and easy-to-understand abstract representation of program semantics, and the defect mode The state machine is used to describe the finite state machine of the defect mode, including the state set D, the state transition set T, and the transition condition set Conditions, where D={$start,$error}∪Dother, T: D×Conditions→D.$start and $error represent the initial state and error state respectively, and Dother represents the collection of other intermediate states.
[0026] Furthermore, the use of array subscripts must be within the ...
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