Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method and system for determining failure features in black feature library

A technology of failure features and determination methods, applied in the fields of instruments, electrical digital data processing, platform integrity maintenance, etc., can solve the problems of poor failure feature search effect, common software insertion, etc., to achieve the effect of protecting safety and improving the search effect.

Active Publication Date: 2014-07-16
ZHUHAI BAOQU TECH CO LTD
View PDF7 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, because it is impossible to put all commonly used software into the commonly used software library, the failure signature finding effect of the prior art is poor

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and system for determining failure features in black feature library
  • Method and system for determining failure features in black feature library
  • Method and system for determining failure features in black feature library

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0044] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0045] Such as figure 1 As shown, a method for determining a failure feature in a black feature library provided by an embodiment of the present invention may include:

[0046] S100. Obtain the first feature in the black feature library;

[0047] Specifically, there may be multiple features in the black feature library. In practical applications, only one feature in the black feature library can be obtained at a time, and then compared with the sample file, o...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The embodiment of the invention provides a method and system for determining failure features in a black feature library. Features in the black feature library can be compared with sample files, when the features in the black feature library hit the sample files according with the abnormal deformation rule as source sample files of the features, it is determined that the features hit error sample files, and the features belong to failure features. The failure features are determined through the abnormal deformation rule, the used sample files can be randomly selected, and thus the failure features do not need to be searched for through a common software library any more, the failure feature search effect is improved, and safety of equipment is protected.

Description

technical field [0001] The invention relates to the technical field of failure feature screening, in particular to a method and system for determining a failure feature in a black feature library. Background technique [0002] With the development of intelligent electronic devices and networks, the threat of computer viruses to the security of users' computers has gradually increased. [0003] In order to protect users' computers, existing security software vendors search for viruses through black signature databases. The features in the black feature library can be extracted from the feature source samples, but there may be invalid features in the extracted features, which will lead to a high false positive rate. In order to remove the failure feature, the existing technology searches for the features in the black feature library by establishing a common software library. If a certain feature hits the software in the common software library, it is determined that the featu...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F21/56
CPCG06F21/561
Inventor 王鑫姚辉陈勇
Owner ZHUHAI BAOQU TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com