Method and system for determining failure features in black feature library
A technology of failure features and determination methods, applied in the fields of instruments, electrical digital data processing, platform integrity maintenance, etc., can solve the problems of poor failure feature search effect, common software insertion, etc., to achieve the effect of protecting safety and improving the search effect.
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[0044] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.
[0045] Such as figure 1 As shown, the method for determining the invalid feature in the black feature library provided by the embodiment of the present invention may include:
[0046] S100. Obtain the first feature in the black feature library;
[0047] Specifically, there can be multiple features in the black feature library. In practical applications, only one feature in the black feature library can be obtained at a time, and then compare...
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