Scan signal generation circuit
A technology for scanning signals and generating circuits, applied in instruments, static indicators, etc., can solve problems such as circuit abnormalities, production yield reduction, and transistor M1 function decline.
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[0024] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.
[0025] refer to figure 2 As shown, it is a scanning signal generation circuit provided by the embodiment of the present invention, which mainly consists of a first transistor M1, a second transistor M2, a first capacitor C1, a third transistor M3, and a fourth transistor M4 , a fifth transistor M5, and a second capacitor C2, and the first transistor M1 to the fifth transistor M5 are all P-type thin film transistors (Thin-Film Transistor, referred to as TFT), wherein:
[0026] The first transistor M1 has a first end 11 for receiving a data signal STV, a first control end 12 for receiving a second frequency signal CK2, and a first end 12 electrically connected to a first node NET1. The second terminal 13; in this embodiment, the first control terminal 12 of the first transistor M1 is a gate terminal and is used to control the conducti...
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