Test circuit and test device

Abstract

The embodiment of the invention discloses a test circuit and a test device. The test circuit includes a light-emitting diode circuit, an over-temperature detection circuit, an over-temperature protection circuit and an alternating current-direct current conversion circuit; the light-emitting diode circuit includes at least two light-emitting diodes and a control switch, wherein the at least two light-emitting diodes and the control switch are connected in series between the positive pole and the negative pole of a direct current voltage-stabilized power source; the over-temperature detection circuit detects the temperature of each light-emitting diode, and outputs over-temperature signals at the output end of the over-temperature detection circuit when the temperature of at least one of the light-emitting diodes exceeds a temperature threshold value; when receiving the over-temperature signals, the driving end of the over-temperature protection circuit emits alarm signals and outputs control signals for controlling the control switch in the light-emitting diode circuit to be switched off; and the output end of the alternating current-direct current conversion circuit is connected with the power source ends of the over-temperature detection circuit and the over-temperature protection circuit. With the test circuit and the test device of the invention adopted, smooth proceeding of a luminous decay aging test can be ensured, and a test period can be shortened, and manpower and material resources can be saved.

Description

technical field [0001] The invention relates to the field of electronic circuits, in particular to a test circuit and a test device. Background technique [0002] In light-emitting diode (Light Emitted Diode, LED) photoaging test, in order to shorten the test cycle, the LED lamp under test is usually placed in a high-temperature box, and the temperature of the high-temperature box is set close to the upper limit of the LED junction temperature value. Since the photoaging test of LED is a long-term power-on test process, the temperature of the high-temperature box may be too high during long-term operation, exceeding the upper limit of the LED junction temperature specified by the supplier, resulting in differences in the measured light decay data Larger, or the LED under test is burned. This may force the photoaging test process that has been carried out for several months or even last year to be terminated and retested, increasing the test cycle and wasting manpower and m...

AI Technical Summary

Problems solved by technology

Since the photoaging test of LED is a long-term power-on test process, the temperature of the high-temperature box may be too high during long-term operation, exceeding the upper limit of the LED junction temperature specified by the supplier, resulting in differences in the measured light decay data Larger, or the LED under test is burned

This may force the photoaging test process that has been carried out for several months or even last year to be terminated and retested, increasing the test cycle and wasting human and material resources

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