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Reconstruct image data from contour data

A technology of contour data and image data, applied in the field of imaging systems

Active Publication Date: 2017-10-10
SIEMENS HEALTHCARE GMBH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The technical problem to be solved by the present invention is to improve the reconstruction of image data from incomplete projection data

Method used

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  • Reconstruct image data from contour data
  • Reconstruct image data from contour data
  • Reconstruct image data from contour data

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Experimental program
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Embodiment Construction

[0025] exist figure 1 A first imaging system with a CT system is firstly shown schematically in . These are so-called third-generation CT systems, but the invention is not limited thereto. In the gantry housing C6 there is a closed gantry, not visible here, on which a first x-ray source C2 in the form of an x-ray tube and an x-ray detector C3 arranged opposite it are arranged. Optionally, a second x-ray tube C4 and an oppositely arranged x-ray detector C5 are arranged in the CT system C1 shown here, so that a higher temporal resolution can be achieved by an additionally provided radiator / detector combination , or where different X-ray energy spectra are used in the emitter / detector system, so-called "dual-energy" inspections can also be performed.

[0026]Furthermore, the CT system C1 has a patient table C8 on which the patient can be moved during an examination along a system axis C9 , also referred to as the z-axis, into the scanning field or measurement field FOV (acronym...

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Abstract

The method according to the invention is based on first projection data (p) acquired during a relative rotational movement between the X-ray source of the CT device and at least one examination object which is partially outside the scanning area of ​​the CT device. That is, the first projection data is incomplete projection data. The inventors have realised that the reconstruction of the incomplete first projection data can be improved using the profile data (k) of the inspection object surface acquired by means of the camera. Here, the spatial correlation between the first projection data (p) and the contour data (k) is known. According to the invention, the first projection data (p) are supplemented by contour data (k) into modified projection data (p'), so that the modified projection data (p') include information about the projection data (p') that lie outside the scanning area of ​​the CT device. Check the outline of the object for information. As a result, fewer or no artifacts are produced when the image data (f) is reconstructed according to the invention by means of the modified projection data (p') than when the image data is reconstructed from the first image data alone.

Description

technical field [0001] The invention relates to a method and an imaging system for reconstructing image data from contour data. Background technique [0002] Computed tomography (CT) is known as a two-stage imaging method. Projection data are acquired here by examining the object with x-ray transmission and acquiring the attenuation of the x-rays along their path from the x-ray source to the x-ray detector. The attenuation is caused by the transmitted material along the ray path, so attenuation can also be understood as the line integral of the attenuation coefficients of all volume elements (voxels) along the ray path. The acquired projection data cannot be interpreted directly, ie they do not produce images of the transmitted layers of the examination object. In a second step, the attenuation coefficients of the individual voxels can be back-calculated from the projection data by reconstruction methods and an image of the distribution of the attenuation coefficients can ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): A61B6/03
CPCA61B6/4441A61B6/5211A61B6/5258G06T11/006G06T2211/432G06T2211/436A61B6/032A61B6/5205G16H50/20G06T5/20G06T5/50
Inventor T.弗洛尔B.施密特M.塞德尔迈尔
Owner SIEMENS HEALTHCARE GMBH