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Common circuit for gate driver on array (GOA) test and shutdown ghost elimination

A shutdown afterimage, circuit technology, applied in static indicators, instruments, etc., can solve problems such as limiting the analysis and improvement of GOA circuit problems, unable to find abnormal GOA units, etc., to achieve the effect of clearing shutdown afterimages

Active Publication Date: 2015-11-25
WUHAN CHINA STAR OPTOELECTRONICS TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, since this method can only test the output signal of the last-level GOA unit, it is impossible to find out which level of GOA unit is abnormal, which limits the analysis and improvement of GOA circuit problems

Method used

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  • Common circuit for gate driver on array (GOA) test and shutdown ghost elimination
  • Common circuit for gate driver on array (GOA) test and shutdown ghost elimination
  • Common circuit for gate driver on array (GOA) test and shutdown ghost elimination

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no. 1 example

[0042] The invention provides a common circuit for GOA testing and clearing after-image after shutdown. figure 2 Shown is the first embodiment of the shared circuit of the GOA test of the present invention and the removal of the afterimage after shutdown, including:

[0043] A plurality of GOA unit circuits cascaded on one side of the display area 1 of the liquid crystal display panel, where n is a positive integer, the output end of the nth level GOA unit circuit is correspondingly connected to the nth grid scanning line Gate(n);

[0044] A first test terminal 3 arranged on one side of the display area 1 of the liquid crystal display panel;

[0045] A second test terminal 5 arranged on one side of the display area 1 of the liquid crystal display panel;

[0046] A test signal line AT1 electrically connected to the first test terminal 3 provided on one side of the display area 1 of the liquid crystal display panel;

[0047] A feedback signal line AT2 electrically connected t...

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Abstract

The invention provides a common circuit for gate driver on array (GOA) test and shutdown ghost elimination. The common circuit is provided with the components of a first test end (3), a test signal line (AT1) which is electrically connected with the first test end (3), a second test end (5), a feedback signal line (AT2) which is electrically connected with the second test end (5), and test thin film transistors (TFT) (T0) of which the number is same with that of a plurality of cascaded GOA unit circuits. Through electrically connecting the gate electrode of each test TFT (T0) with the test signal line (AT1), electrically connecting the source electrode with the feedback signal line (AT2), and electrically the drain electrode with the output end and the gate electrode scanning line of a corresponding GOA unit circuit, the output signal of a random-grade GOA unit circuit in a GOA circuit can be tested, and the specific position of an abnormity in the GOA circuit can be determined. Furthermore residual charges in liquid crystal capacitors and storage capacitors in the liquid crystal panel display area can be released in shutdown, thereby eliminating the ghost in shutdown.

Description

technical field [0001] The invention relates to the technical field of liquid crystal display, in particular to a shared circuit for GOA testing and shutdown afterimage removal. Background technique [0002] A liquid crystal display (Liquid Crystal Display, LCD) has many advantages such as a thin body, power saving, and no radiation, and has been widely used. Such as: LCD TV, mobile phone, personal digital assistant (PDA), digital camera, computer screen or notebook computer screen, etc., occupy a dominant position in the field of flat panel display. [0003] Most of the liquid crystal displays currently on the market are backlight liquid crystal displays, which include a liquid crystal display panel and a backlight module. The working principle of the liquid crystal display panel is to pour liquid crystal molecules between the thin film transistor array substrate (ThinFilmTransistorArraySubstrate, TFTArraySubstrate) and the color filter substrate (ColorFilter, CF), and app...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G09G3/00G09G3/36
CPCG09G3/006G09G3/3677G09G2300/0408G09G3/18G09G3/3611
Inventor 曹尚操
Owner WUHAN CHINA STAR OPTOELECTRONICS TECH CO LTD
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