Single Event Sensitivity Judgment Method Based on Different Instruction Sets of Pulsed Laser Devices
A technology of pulse laser and determination method, which is applied in the direction of single semiconductor device testing, measuring devices, instruments, etc.
Active Publication Date: 2018-05-08
BEIJING MXTRONICS CORP +1
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Problems solved by technology
[0005] The technical problem solved by the present invention is: to overcome the serious lack of existing testing machines, to provide a single particle sensitivity judgment method based on different test command sets of pulsed laser equipment, and to solve the problem of devices under different test command sets For the estimation of single event sensitivity, the single event susceptibility of semiconductor circuits under different test instruction sets can be estimated only by performing pulsed laser tests on the circuit and a small amount of heavy ion tests
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[0031] We take advantage of the flexibility and simple operation of the pulsed laser machine to predict and analyze the single event sensitivity of semiconductor devices with different instruction sets. The method of the present invention obtains the single particle error cross sections of semiconductor devices under different test instruction sets through the pulse laser test, obtains its correlation coefficient through analysis, and finally combines a small amount of heavy ion test data, and can predict according to the proportional coefficient obtained by the pulse laser test. Estimate the single event susceptibility of semiconductor devices under different test instruction sets.
[0032] It can be seen from this that, for any circuit, the single event sensitivity correlation coefficient between different test instruction sets is obtained, combined with a small amount of heavy ion experiments, and finally through the above calculations, it can be estimated that the circuit u...
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The invention discloses a single particle sensitivity determination method based on various order set of a pulse laser device. The method considers the difference between the various test orders of members and the diversity of the environment, and comprises steps of obtaining the single particle sensitivity coefficient between various test order sets through performing pulse laser single particle test under various test order sets, performing a single particle irradiation test of one test order set under a heavy ion accelerator and determining the single particle irradiation test result under other test order sets through calculation. The invention disclosed by the invention solves the shortcoming that the heavy ion machine hour is tense, the machine hour of using the pulse laser is flexible, the operation is easy, data obtaining is convenient and the the process of determining the sensitivity of the single particle is difficult.
Description
technical field [0001] The invention relates to a single particle sensitivity judgment method based on different test instruction sets of pulsed laser equipment. Background technique [0002] Nowadays, with the reduction of the process size of semiconductor devices, its single event effect is becoming more and more significant, seriously affecting the safety of space missions. Therefore, before semiconductor devices are actually used in space missions, they must be evaluated for their susceptibility to single event effects. [0003] Complex integrated circuits are composed of different functional modules, and their single-event sensitivity is not only related to the sensitivity of each physical unit, but also related to the test procedure. Single event sensitivities can vary widely when different sensitive units are tested or when different test procedures are used. [0004] At present, high-energy particle accelerator testing is limited by factors such as complex LET valu...
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IPC IPC(8): G01R31/265
CPCG01R31/2656
Inventor 于春青赵元富范隆岳素格陈茂鑫郑宏超杜守刚陈莉明马建华王煌伟毕潇姜柯简贵胄初飞
Owner BEIJING MXTRONICS CORP