A mipi LP signal testing system and method

A signal test and signal technology, applied in the field of signal processing, can solve the problems of low efficiency of manual decoding and error-prone, and achieve the effect of improving test efficiency, convenient operation and reducing test difficulty.

Active Publication Date: 2018-10-30
WUHAN JINGCE ELECTRONICS GRP CO LTD
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Problems solved by technology

[0006] (3) For the stored waveform picture, it is necessary to manually decode the LP signal according to the LP protocol, convert it into a hexadecimal value and compare it with the actual value. Due to the large amount of data, the manual decoding efficiency is low and error-prone

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  • A mipi LP signal testing system and method
  • A mipi LP signal testing system and method
  • A mipi LP signal testing system and method

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Embodiment Construction

[0039] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.

[0040] The MIPI LP signal test system provided by the embodiment includes a signal receiving unit, a signal acquisition unit and a signal transmission unit connected in sequence; the system block diagram applied to the test is as follows figure 1 shown;

[0041] The signal receiving unit is connected with the module to be tested through the test probe, and eliminates clutter and amplifies the s...

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Abstract

The invention discloses an MIPI LP signal test system and method. The system comprises a signal receiving unit, a signal collection unit and a signal transmission unit, which are connected in sequence, wherein the signal receiving unit is used for eliminating clutter and amplifying a detection signal; the signal collection unit is used for carrying out differential transfer single end processing on the processed signal and sampling the single end signal according to upper layer setting until sampling data reach a set sampling depth; the signal transmission unit sends the sampling data to an external upper computer, and the upper computer draws a waveform and analyze the data according to the received sampling data; and the method comprises the following steps: collecting data according to preset sampling frequency based on the device, triggering the signal satisfying a trigger condition, and allocating the signal to a signal storage unit until reaching the preset sampling depth; extracting the data in the signal storage unit through the upper computer for analyzing the same and drawing the waveform; and analyzing the obtained data to reduce the same into a signal waveform remotely. The MIPI LP signal test system and method have the advantages of high efficiency and are suitable for the working mode of cooperative test development in two places.

Description

technical field [0001] The invention belongs to the technical field of signal processing, and more specifically relates to a MIPI LP signal testing system and method. Background technique [0002] At present, the MIPI screen is the mainstream screen of the mobile phone screen. When the MIPI screen is clicked, the LP (Low Power, low power consumption) signal of channel 0 is required to issue the screen opening command, and the success of the screen opening command is directly related to the screen click. On the other hand, the LP signal can also be used to read and write Extended Display Identification Data (EDID). Whether the LP signal communicates normally is related to the correctness of EDID reading and writing. [0003] When the MIPI screen cannot be lit normally or the value read and written by EDID does not match the actual value, it is necessary to test the LP signal to find the cause of the fault; the traditional method is to use an oscilloscope to manually test the ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04M1/24
CPCH04M1/24
Inventor 余广得刘斌许志松
Owner WUHAN JINGCE ELECTRONICS GRP CO LTD
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