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A column selection line driver power supply control circuit and method

A power supply control circuit and line driver technology, applied in the direction of instruments, static memory, digital memory information, etc., can solve the problem that the write reliability of the array sense amplifier cannot be individually optimized, and achieve simple structure, reasonable design, and reduced leakage current Effect

Active Publication Date: 2019-01-15
XI AN UNIIC SEMICON CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, it is impossible to optimize the write reliability of the array sense amplifier during the write operation, the ability to resist write disturbance during the write operation, the read reliability during the read operation, and the leakage current of the column selection line driver

Method used

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  • A column selection line driver power supply control circuit and method
  • A column selection line driver power supply control circuit and method

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Embodiment Construction

[0029] The present invention will be further described in detail below in conjunction with specific embodiments, which are for explanation rather than limitation of the present invention.

[0030] The present invention provides a column selection line driver power control circuit, which includes a control circuit and an output driver connected in sequence. The output driver provides the power supply voltage for the column selection line driver. The output driver consists of two P-type field effect tubes and one N-type field effect tube; the control circuit controls the conduction of the N-type field effect tube and the P-type field effect tube in the output driver And turn off.

[0031] Among them, the source terminals of the two P-type field effect transistors are respectively connected to the overdrive voltage VOD as the write column selection line voltage VCSL_WR and the internal power supply voltage VINT as the read column selection line voltage VCSL_RD. The source terminal of...

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Abstract

The invention provides a column selection line driver power control circuit and method.Writing operation and reading operation are conducted on a dynamic random access memory; during pre-charge operation, different column selection line driver voltages are used for optimizing the reading and writing reliability and writing interference resistance of an array sense amplifier and the leakage current of a column selection line driver.A row address effective signal RAVLD, a writing data shielding signal DM and a writing enable signal WE are used as control signals, the control circuit is used for logic control over the three signals, different outputs corresponding to different signal states are output, corresponding on-off control is conducted on a power device in an output driver, and therefore the corresponding different voltages can be output reasonably.As a result, different demands for the power voltages in different demand states are met, the structure is simple, control is convenient, realization is easy, reliability and stability are achieved, energy consumption is reduced, and the service life is prolonged.

Description

Technical field [0001] The invention relates to the field of dynamic random access memory design, in particular to a column selection line driver power control circuit and method. Background technique [0002] Dynamic random access memory is an indispensable unit of personal computers and mobile devices, and its reliability and static power consumption affect the reliability and standby time of the entire system of personal computers and mobile devices. As an important unit in the dynamic random access memory, the column selection line driver has a huge number and is used to generate a column selection line that controls the read and write operations of the array sensitive amplifier. [0003] The write reliability of the array sense amplifier during the write operation, the ability to resist write interference during the write operation, and the read reliability during the read operation are all closely related to the column selection line voltage. The relationship between the wri...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11C11/4074G11C11/409
CPCG11C11/4074G11C11/409
Inventor 熊保玉段会福
Owner XI AN UNIIC SEMICON CO LTD
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